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A Capability Index Calibrated to the Nonconformance Probability

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Published/Copyright: March 10, 2010
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Stochastics and Quality Control
From the journal Volume 19 Issue 1

Abstract

Process Capability indices have become popular for describing how well a process meets specified tolerances. The lack of affinity with the process nonconformance probability p and the difficulty of dealing with the sampling distribution of their natural estimators affect greatly the use of the traditional indices as Cp, Cpk, Cpm and Cpkm. In this paper, a capability index is proposed which is calibrated to the nonconformance probability. Moreover, Bayesian inference procedures under multinomial sampling are developed for simplifying application of the index in industry.

Keywords:: Process capability analysis; nonconformance probability; two-sided specification limits; one-sided specification limit
Published Online: 2010-03-10
Published in Print: 2004-April

© Heldermann Verlag

Articles in the same Issue

  1. Economic Design of A Dynamic CCC – r Chart for High-Yield Processes
  2. A Note on Average Run Lengths of Moving Average Control Charts
  3. A Group Runs Control Chart for Detecting Shifts in the Process Mean
  4. A Capability Index Calibrated to the Nonconformance Probability
  5. Stochastic Methods for Production Processes
  6. Parametric Bivariate Regression Analysis Based on Censored Samples: A Weibull Model
  7. A Note on Savings in Experimental Time Under Type II Censoring
  8. Expected Time for Attainment Threshold Level A Shock Model Approach
  9. Maintenance Models for a Repairable System
  10. Minimum Average Fraction Inspected for Combined Continuous Lot by Lot Acceptance Sampling Plan
  11. Minimum Risk Acceptance Sampling Plans: A Review
  12. Improving Resistivity of Resin
https://doi.org/10.1515/EQC.2004.45
Keywords for this article
Process capability analysis; nonconformance probability; two-sided specification limits; one-sided specification limit

Articles in the same Issue

  1. Economic Design of A Dynamic CCC – r Chart for High-Yield Processes
  2. A Note on Average Run Lengths of Moving Average Control Charts
  3. A Group Runs Control Chart for Detecting Shifts in the Process Mean
  4. A Capability Index Calibrated to the Nonconformance Probability
  5. Stochastic Methods for Production Processes
  6. Parametric Bivariate Regression Analysis Based on Censored Samples: A Weibull Model
  7. A Note on Savings in Experimental Time Under Type II Censoring
  8. Expected Time for Attainment Threshold Level A Shock Model Approach
  9. Maintenance Models for a Repairable System
  10. Minimum Average Fraction Inspected for Combined Continuous Lot by Lot Acceptance Sampling Plan
  11. Minimum Risk Acceptance Sampling Plans: A Review
  12. Improving Resistivity of Resin
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