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A Group Runs Control Chart for Detecting Shifts in the Process Mean
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M. P. Gadre
Veröffentlicht/Copyright:
10. März 2010
Abstract
Wu and Spedding [Journal of Quality Technology 32: 32-38, 2000] have proposed the synthetic control chart to detect small shifts in process mean. In this paper, for the same problem, we propose a control chart called ’Group Runs’ (GR) control chart, which is a combination of Shewhart's 
chart and an extended version of conforming run length chart. It is numerically verified that, the GR chart gives a significant reduction in out of control ATS as compared to those of the synthetic control chart and chart when in-control ATS is not smaller than a certain number. Steady state performance of the GR chart is also better. Hence, GR chart turns out to be economical to detect small shifts in the process mean.
Published Online: 2010-03-10
Published in Print: 2004-April
© Heldermann Verlag
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Artikel in diesem Heft
- Economic Design of A Dynamic CCC – r Chart for High-Yield Processes
- A Note on Average Run Lengths of Moving Average Control Charts
- A Group Runs Control Chart for Detecting Shifts in the Process Mean
- A Capability Index Calibrated to the Nonconformance Probability
- Stochastic Methods for Production Processes
- Parametric Bivariate Regression Analysis Based on Censored Samples: A Weibull Model
- A Note on Savings in Experimental Time Under Type II Censoring
- Expected Time for Attainment Threshold Level A Shock Model Approach
- Maintenance Models for a Repairable System
- Minimum Average Fraction Inspected for Combined Continuous Lot by Lot Acceptance Sampling Plan
- Minimum Risk Acceptance Sampling Plans: A Review
- Improving Resistivity of Resin
Schlagwörter für diesen Artikel
-Chart;
CRL Chart;
Synthetic Chart;
Average Time to Signal (ATS);
Steady State ATS
Artikel in diesem Heft
- Economic Design of A Dynamic CCC – r Chart for High-Yield Processes
- A Note on Average Run Lengths of Moving Average Control Charts
- A Group Runs Control Chart for Detecting Shifts in the Process Mean
- A Capability Index Calibrated to the Nonconformance Probability
- Stochastic Methods for Production Processes
- Parametric Bivariate Regression Analysis Based on Censored Samples: A Weibull Model
- A Note on Savings in Experimental Time Under Type II Censoring
- Expected Time for Attainment Threshold Level A Shock Model Approach
- Maintenance Models for a Repairable System
- Minimum Average Fraction Inspected for Combined Continuous Lot by Lot Acceptance Sampling Plan
- Minimum Risk Acceptance Sampling Plans: A Review
- Improving Resistivity of Resin
