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Reliability Test Plans for Exponentiated Log-Logistic Distribution

  • K. Rosaiah , R. R. L. Kantam und Santosh Kumar
Veröffentlicht/Copyright: 10. März 2010
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Stochastics and Quality Control
Aus der Zeitschrift Band 21 Heft 2

Abstract

A generalization of the log-logistic distribution called exponentiated log-logistic distribution (in lines of exponentiated Weibull distribution suggested by Mudholkar and Srivastava [Technometrics 37: 436-445, 1995]) is considered. In this paper the operating characteristic for a sampling plan is determined for the case that a lot of products is submitted for inspection with lifetimes specified by an exponentiated log-logistic distribution (ELLD). The results are illustrated by a numerical example.

Published Online: 2010-03-10
Published in Print: 2006-October

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