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Measurements of Microfields on Semiconductors

  • G. V. Spivak und E. I. Rau
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Volume 55, Number 2 October 16
Ein Kapitel aus dem Buch Volume 55, Number 2 October 16
© 2021 Walter de Gruyter GmbH, Berlin/Munich/Boston

© 2021 Walter de Gruyter GmbH, Berlin/Munich/Boston

Kapitel in diesem Buch

  1. Frontmatter I
  2. Classification Scheme II
  3. PROFESSOR Dr. Dr. h.c. HEINZ BETHGE V
  4. Contents 345
  5. Original Papers
  6. On Cluster Mobilities in Nucleation and Growth Processes of Epitaxial Thin Films 353
  7. On the Saturation Cluster Density in Deposition of Thin Films from Vapours 369
  8. Conditions of Step Decoration on Crystal Surfaces 375
  9. Observation of NaCl-LiCl High-Temperature Phases by Gold Decoration on the Solid-Melt Interface of Czochralski Grown Crystals 385
  10. On the Gold Decoration of KCl:Pb Crystal Surfaces 395
  11. Observation and Interpretation of Spirals for Spiral Growth from the Liquid State 403
  12. Monte-Carlo Simulation of Dendritic Growth from the Melt 415
  13. Formation of Aluminium Thin Films in the Presence of Oxygen and Nickel 427
  14. Sulphur Segregation on the (111) Iron Surface Studied by LEED, AES, and WFC 437
  15. Stationary Stochastic Adparticle Flip-Flop as a Precursor to Surface Diffusion 447
  16. A Theory of the Snoek-Köster Relaxation (Cold-Work Peak) in Metals 457
  17. Cross Slip of Single Dissociated Screw Dislocations in Silicon and Germanium 469
  18. Aggregation and Precipitation Hardening in NaCl : Ca Crystals 479
  19. Formation of Radiation-Induced Voids on Dislocations in LiF 489
  20. TEM Studies of Displacement Cascades in Ion-Bombarded Cu3Pd and Fe3Al 497
  21. Precipitation and Dissolution Processes in Age-Hardenable A1 Alloys. A Comparison of Positron Annihilation and X-Ray Small-Angle Scattering Investigations (I) 509
  22. Problems of the Formation of Dislocation Structures in Heteroepitaxial Layers 519
  23. Crack Propagation in MgO during In-Situ Deformation in the High-Voltage Electron Microscope 529
  24. Microstructure Dependence of the Brittle Fracture of Alumina 537
  25. Penetration and Resolution of STEM and CTEM in Amorphous and Polycrystalline Materials 545
  26. Methodical Aspects of HVEM in In-Situ Experiments in the Field of Condensed Matter 549
  27. The Role of Environmental Conditions in In-Situ Experiments in the High-Voltage Electron Microscope 563
  28. On the Determination of Intergranular Orientation Relationships by Kikuchi Electron Diffraction 569
  29. Analysis of Many-Beam Lattice Images of Y - A l Garnet Crystals 573
  30. Dislocation Emission in CdS 583
  31. Measurements of Microfields on Semiconductors 589
  32. Alignment of Defects in Ge Implanted with Te+ Ions 599
  33. On X-Ray and Electron Microscopic Characterization of Lattice Defects in AIIBVI Semiconductor Compounds 603
  34. Combined Scanning (EBIC) and Transmission Electron Microscopic Investigations of Dislocations in Semiconductors 611
  35. Vieillissement dynamique dans l'alliage Fe-Co-2%V 621
  36. Influence of the Lattice Component on the Thermal Conductivity Minimum of Aluminium 631
  37. Electronic Conduction in Dye-Sensitized Selenium Films 635
  38. The Effect of Ag Impurity on the Real Structure of ZnTe 639
  39. Distribution of Ion-Bombardment Implanted 85Kr in Si, Cu, and SiO2 647
  40. Photoconductive Properties of Sputtered TiO2 Films 653
  41. On the Theory of Double Injection in Semiconductors with Continuous Distribution of Trapping Levels within the Gap 661
  42. On the Room Temperature Stability of Metastable Phases Formed at 200 °C in Al-Zn Alloys 673
  43. Imaging Hexagonal Based Superstructures. A New Stable Orthorhombic Structure in the Au-Mn System 681
  44. The Phenomenon of Controllable Hydrogen Phase "Naklep" of Metals and Alloys 691
  45. On the Electrical Activity of Oxygen in Silicon 699
  46. Electron Microscopic Study of the Domain Structure and of the Transition State in Cu0.5In2.5Se4 709
  47. Spectroscopic Study of Phase Polymorphism and Vibrational Assignments for 2,2-Dinitropropane 723
  48. A Study of Thermal Conversion of Interstitials in Platinum by Means of Electrical Resistivity Measurements 735
  49. TEM Method for Identification of Domains in Materials Which Undergo a Pm3m -> R3c or R3c Phase Transition 747
  50. The Stress Relaxation of Polyvinyl Chloride in the Macrodeformation Range 751
  51. Magnetostriction Measurements on Co-Base Amorphous Alloys 763
  52. The Electrical Recombination Efficiency of Individual Edge Dislocations and Stacking Fault Defects in n-Type Silicon 771
  53. Flow Stress and Activation Volume of Some Cold-Worked Copper-Based Solid Solutions 785
  54. A Novel Technique for Preparing Tungsten Field Cathodes with [001] Orientation 793
  55. Grain Boundary Analysis in TEM (III) 801
  56. Short Notes
  57. Influence of Structural Defects and Concentration Inhomogeneities in GaAs Epitaxial Layers on Reverse I-U Characteristics of Schottky Barrier Diodes 813
  58. Silicon Beam Epitaxy for Fabrication of Devices 817
  59. Entropy and Volume of Solution of Substitutional Impurities in Solids 821
  60. Helical Density Waves in a Strongly Degenerate Electron-Hole Plasma 825
  61. Domain Wall Resonance in Zn and Cu Substituted Magnetite 831
  62. Zur Auswertung der Gleichungen der Lindhard-Scharff-Schiott-Theorie 835
  63. Debye Temperatures of Silver and Aluminium at High Temperatures. Some New Correlations 841
  64. The Crystal Structures of HoF3 and TbF3 by Neutron Diffraction 845
  65. Theimoluminescence of Z1 Centres in NaCl:Ca 849
  66. The Effect of Real Structure on Optical Properties of ZnTe 855
  67. Observation of Conductivity Anomalies in Small Needle-Like Crystals of TEA(TCNQ)2 861
  68. High Orientation of Coprecipitated Barium Ferrite by Uniaxial Hot- Pressing 865
  69. Photovoltaic Effect and Photoconductivity in Reduced Potassium Niobate Crystals 867
  70. Activation theimique de la deformation plastique de l'oxyde cuivreux 873
  71. Electronic Mobility in Polyethylene Terephthalate 879
  72. Overlapping between Magnetic and a-y Transition in the FePd System 883
  73. Critical Damping Condition in IMP ATT Diodes 889
  74. Pre-Printed Titles
  75. Pre-Printed Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) 893
  76. Classsification Scheme — Continued 901
  77. Backmatter 902
Heruntergeladen am 21.9.2025 von https://www.degruyterbrill.com/document/doi/10.1515/9783112500989-028/html
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