Startseite Technik Determination of Stress Gradients by X-ray Diffraction: Comparison of Different Methods and Applications
Artikel
Lizenziert
Nicht lizenziert Erfordert eine Authentifizierung

Determination of Stress Gradients by X-ray Diffraction: Comparison of Different Methods and Applications

  • Stéphanie Bein , Christian Le Calvez und Jean-Lou Lebrun
Veröffentlicht/Copyright: 14. Dezember 2021
Veröffentlichen auch Sie bei De Gruyter Brill

Abstract

The paper presents a review of the main theoretical formulations of the analysis of steep stress gradients by X-ray diffraction and a comparison of calculations with experimentally applied stresses in a four-point bending test on a beryllium specimen. The comparison between theoretical approaches and experiments is therefore limited to uniaxial linear stress gradients. It shows that, in this case, only an evaluation of stress gradient can be obtained from the analysis of X-ray diffraction measurements even when experiments are performed very carefully. In this direction, very complex formulations could often not be necessary. Then, a summary of advantages and drawbacks of each theoretical approach is presented. Finally, for different forms of stress gradients, the paper proposes the most convenient formalism and experimental technique to be used.


S. Bein, Laboratoire Sols, Solides et Structures (CNRS UMR 5521 - INPG/ UJF), B.P. 53, F-38041 Grenoble CEDEX 9 , France
Ch. Le Calvez, CRMC, Creusot Loire Industrie, 56 rue Clemenceau, F-71202 Le Creusot, France.
J.-L. Lebrun, LM3 - METX, URA CNRS 1219, ENSAM, 151 bd de l'Hôpital, F-75013 Paris, France.

  1. The authors gratefully acknowledge the team of LURE laboratory (Orsay) for allowing the use of synchrotron radiation and for valuable help in performing the experiments. The authors also acknowledge P. Gergaud for stimulating discussions and developments about GIXD formulae and C. Saifoudine for participating in the experimentations.

Literature

1 Dölle, H.: J. Appl. Cryst. 12 (1979) 489–501.10.1107/S0021889879013169Suche in Google Scholar

2 Sprauel, J.M.; Barred, M.; Torbaty, S.: Advances in X-ray analysis, Plenum Press, New-York 26 (1983) 217–224.10.1154/S0376030800012519Suche in Google Scholar

3 Eigenmann, B.; Schottes, B.; Macherauch, E.: ICRS3, Elsevier Applied Science, London/New York 1 (1992) 601–606.Suche in Google Scholar

4 Sasaki, T; Kuramoto, M.; Yoshioka, Y:Advances in X-ray analysis, Plenum Press, New York 28 (1985) 255–264.10.1154/S0376030800014063Suche in Google Scholar

5 Sasaki, T; Kuramoto, M.; Yoshioka, Y:Advances in X-ray analysis, Plenum Press, New York 28 (1985) 265–274.10.1154/S0376030800014075Suche in Google Scholar

6 Eckhardt, M.; Ruppersberg, H.:Z. Metallkd. 79 (1988) 662–666.Suche in Google Scholar

7 Ruppersberg, H. et al:phys. stat. sol. (1989) 681–687.10.1002/pssa.2211160226Suche in Google Scholar

8 Shibano, J.; Ukai, T:as Ref. [3] 601–606.Suche in Google Scholar

9 Ji, N.; Lebrun, J.L; Obadia, S.: as Ref. [3] 397–402.Suche in Google Scholar

10 Lebrun, J.L.; Bonnet, C.; Brousse, D.; Girard, G.; Francois, M.: as Ref. [3] 638–643.Suche in Google Scholar

11 Eigenmann, B. ; Macherauch, E.:Nucl. Instr. and Meth. in Physics Res. B (1995) 92–97.10.1016/0168-583X(94)00410-2Suche in Google Scholar

12 Leverenz, I; Eigenmann, B.; Macherauch, E.: Z. Metallkd. 87 (1996) 283–297.Suche in Google Scholar

13 Hauk, V.; Krug, W.K.:ICRS, DGM, Oberarsel (1987) 303–310.Suche in Google Scholar

14 Fillit, R. Y.; Perry, A.J.:Surface and coatings technology 36 (1988) 647–659.10.1016/0257-8972(88)90006-0Suche in Google Scholar

15 Doerner, M.F.; Brennan, S.:J. Appl. Phys. 63 (1988) 126–131.10.1063/1.340503Suche in Google Scholar

16 Shut, C.J.; Cohen, J.B.:J. Appl. Phys. 70 (1991) 2104–2110.10.1063/1.349446Suche in Google Scholar

17 de Buyser, L.; van Houtte, P.; Aemoudt, E.:ICRS3, Elsevier, London, New York 1 (1992) 921–926.Suche in Google Scholar

18 Predecki, P; Zhu, X.; Ballrad, B.:Advances in X-ray analysis, Plenum Press, New York 36 (1993) 237–244.10.1154/S037603080001884XSuche in Google Scholar

19 Zhu, X.; Predecki, P.:Advances in X-ray analysis, Plenum Press, New York 37 (1994) 197-203.10.1154/S037603080001569XSuche in Google Scholar

20 Kröner, E.:Z. Phys. 151 (1958) 504–518.10.1007/BF01337948Suche in Google Scholar

21 Noyan, I.C.; Cohen, J.B.:Residual Stress Measurements by Diffraction, Springer-Verlag, New York (1987).Suche in Google Scholar

Received: 1997-01-29
Published Online: 2021-12-14

© 1998 Carl Hanser Verlag, München

Heruntergeladen am 2.2.2026 von https://www.degruyterbrill.com/document/doi/10.3139/ijmr-1998-0051/html?lang=de
Button zum nach oben scrollen