Wear and Damage Characterization of Coated Carbide Tools by means of FIB-SEM Microscopy
-
T. Kresse
Abstract
In this work, two commercial indexable inserts with different coatings were examined with regard to their damage and wear characteristics after tool life testing on two different types of gray cast iron. The surface and chemical analysis by means of Scanning Electron Microscopy (SEM) and/or Energy Dispersive X-ray Spectroscopy (EDS) revealed a removal of the respective protective layer on the wear surface in varying degrees. In addition to that, crack structures were identified that take various forms as a function of the coating. The integrated Focused Ion Beam technology (FIB) also allowed to examine the identified cracks with regard to their propagation in the depth of the respective component. The cracks extend deep into the WC-Co base material and mainly propagate through the ductile Co phase.
Kurzfassung
In dieser Arbeit wurden zwei unterschiedlich beschichtete kommerzielle Wendeschneidplatten nach Standzeitversuchen an zwei verschiedenen Graugussarten hinsichtlich ihrer Schadens- und Verschleißcharakteristika untersucht. Die oberflächliche und chemische Analyse mittels Rasterelektronenmikroskopie (REM) bzw. Energiedispersiver Röntgenspektroskopie (EDX) ergab einen unterschiedlich starken Abtrag der jeweiligen Schutzschicht auf der Verschleißfläche, zudem konnten abhängig von der Beschichtung unterschiedlich ausgeprägte Rissstrukturen identifiziert werden. Mit Hilfe der integrierten Ionenfeinstrahltechnik (FIB) konnten die identifizierten Risse auch hinsichtlich ihres Verlaufs in der Tiefe innerhalb des jeweiligen Bauteils analysiert werden. Die Risse reichen bis tief in das aus WC-Co bestehende Grundmaterial hinein und verlaufen dabei größtenteils durch die duktile Co-Phase.
References / Literatur
[1] Dearnley, P. A.: J. Eng. Mater. Technol.107 (1985), 68–8210.1115/1.3225773Search in Google Scholar
[2] Gurland, J.: Int. Mater. Rev.33 (1988), 151–16610.1179/imr.1988.33.1.151Search in Google Scholar
[3] Konyashin, I. Y.: Surf. Coat. Tech.71 (1995), 277–28310.1016/0257-8972(94)02325-KSearch in Google Scholar
[4] Lux, B.; Colombier, C.; Altena, H.; Stjernberg, K.: Thin Solid Films138 (1986), 49–6410.1016/0040-6090(86)90214-2Search in Google Scholar
[5] Jindal, P. C.; Santhanam, A. T.; Schleinkofer, U.; Shuster, A.F.: Int. J. Refract. Met. Hard Mater.17 (1999), 163–17010.1016/S0263-4368(99)00008-6Search in Google Scholar
[6] Teppernegg, T.; Klünsner, T.; Angerer, P.; Tritremmel, C.; Czettl, C.; KeckesJ.; Ebner, R.; Pippan, R.: Int. J. Refract. Met. Hard Mater.47 (2014), 80–8510.1016/j.ijrmhm.2014.07.005Search in Google Scholar
[7] Dearnley, P.A.; Trent, E.M.: Met. Technol.9 (1982), 60–7510.1179/030716982803285909Search in Google Scholar
© 2018, Carl Hanser Verlag, München
Articles in the same Issue
- Contents/Inhalt
- Contents
- Editorial
- Editorial
- Technical Contributions/Fachbeiträge
- Microstructural Characterization of Martensitic Q&P Steels – a Comparison of Etching Techniques and Electron Backscatter Diffraction
- Method for the Detection of Grain Boundaries in α Ti-Based Alloys by means of Polarized Light Microscopy and Image Processing in MATLAB
- Investigation of the Precipitation Behavior of H-Carbides in a TiAl Alloy containing Carbon by means of in- and ex-situ Characterization
- Wear and Damage Characterization of Coated Carbide Tools by means of FIB-SEM Microscopy
- Meeting Diary/Veranstaltungskalender
- Meeting Diary
Articles in the same Issue
- Contents/Inhalt
- Contents
- Editorial
- Editorial
- Technical Contributions/Fachbeiträge
- Microstructural Characterization of Martensitic Q&P Steels – a Comparison of Etching Techniques and Electron Backscatter Diffraction
- Method for the Detection of Grain Boundaries in α Ti-Based Alloys by means of Polarized Light Microscopy and Image Processing in MATLAB
- Investigation of the Precipitation Behavior of H-Carbides in a TiAl Alloy containing Carbon by means of in- and ex-situ Characterization
- Wear and Damage Characterization of Coated Carbide Tools by means of FIB-SEM Microscopy
- Meeting Diary/Veranstaltungskalender
- Meeting Diary
