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Novel Applications of a Focused Ion Beam Workstation for Specimen Preparation and Nanostructuring
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Published/Copyright:
May 8, 2013
Received: 2006-11-14
Accepted: 2007-1-9
Published Online: 2013-05-08
Published in Print: 2007-05-01
© 2007, Carl Hanser Verlag, München
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Articles in the same Issue
- Contents/Inhalt
- Inhalt / Contents
- Editorial
- Editorial
- Technical Contributions/Fachbeiträge
- Elektronenmikroskopische Untersuchung der Mikrostruktur von pseudoelastischen NiTi-Stents
- Metallographic Studies on a Defective Plate Heat Exchanger
- Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM
- Fabrication and Modification of Photonic Structures with Focused Ion Beam
- Novel Applications of a Focused Ion Beam Workstation for Specimen Preparation and Nanostructuring
- Automated X-Ray Elemental Analysis in Three Dimensions Using a Dual Beam-Focused Ion Beam System
Articles in the same Issue
- Contents/Inhalt
- Inhalt / Contents
- Editorial
- Editorial
- Technical Contributions/Fachbeiträge
- Elektronenmikroskopische Untersuchung der Mikrostruktur von pseudoelastischen NiTi-Stents
- Metallographic Studies on a Defective Plate Heat Exchanger
- Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM
- Fabrication and Modification of Photonic Structures with Focused Ion Beam
- Novel Applications of a Focused Ion Beam Workstation for Specimen Preparation and Nanostructuring
- Automated X-Ray Elemental Analysis in Three Dimensions Using a Dual Beam-Focused Ion Beam System
