Elektronenmikroskopische Untersuchung der Mikrostruktur von pseudoelastischen NiTi-Stents
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Kurzfassung
Nickel-Titan-Formgedächtnislegierungen (NiTi-FGL) werden seit einigen Jahren kommerziell erfolgreich eingesetzt. Insbesondere im Bereich der Medizintechnik gibt es zahlreiche Anwendungen, bei denen sich NiTi etabliert hat. Ein Beispiel dafür sind Gefäßprothesen (Stents). Auch wenn NiTi-Stents zur Zeit nur einen Anteil von cirka 12% der weltweit mehr als 3,5 Millionen implantierten Stents pro Jahr ausmachen, wird der Markt für endo- und kardiovaskuläre Stents 2006 ein Volumen von 5,5 Milliarden Euro überschreiten [1, 2]. Bei der Stent-Produktion entstehen Oberflächendefekte, welche unter Ermüdungsbeanspruchung zur Rissbildung beitragen können. Für die Hersteller von Stents sind daher Oberflächenqualität und Mikrostruktur mit Hinblick auf die funktionalen Eigenschaften und Ermüdungsbeständigkeit wichtige Faktoren. In der vorliegenden Arbeit wurden NiTi-Stents mit Hilfe von raster- sowie transmissionselektronenmikroskopischen (TEM) Methoden untersucht. Die Probenpräparation für TEM-Untersuchung wurde mit Hilfe einer Fokussierbaren Ionenstrahlanlage (FIB) durchgeführt, weil aufgrund der geringen Dimensionen eine andere Probenpräparation extrem schwierig ist. Dieses Verfahren wird ausführlich beschrieben und die Ergebnisse diskutiert.
Abstract
Nickel titanium shape memory alloys (NiTi-SMA) have been commercially available for a number of years. Particularly in the field of medical technology there are applications in which NiTi alloys have become established. One such example is in arterial prosthetics as stents. Even though NiTi-stents account for only about 12% of the more than 3.5 million stents implanted each year, the market for endo- and cardiovascular stents in 2006 will be worth over 5.5 billion Euros [1, 2]. In the production of stents surface defects occur which, under fatigue loading, can result in the formation of cracks. For the manufacturer of stents, microstructure and surface quality in respect of the functional properties and resistance to fatigue of the stents are thus both important factors. In the work presented here NiTi stents are examined with the aid of scanning (SEM) and transmission electron microscopic (TEM) methods. The specimen preparation for the TEM examinations was carried out with the aid of a focused ion beam unit (FIB) because due to their extremely small size, any alternative method of preparation would have been extremely difficult. The procedure used is discussed and described in detail.
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© 2007, Carl Hanser Verlag, München
Articles in the same Issue
- Contents/Inhalt
- Inhalt / Contents
- Editorial
- Editorial
- Technical Contributions/Fachbeiträge
- Elektronenmikroskopische Untersuchung der Mikrostruktur von pseudoelastischen NiTi-Stents
- Metallographic Studies on a Defective Plate Heat Exchanger
- Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM
- Fabrication and Modification of Photonic Structures with Focused Ion Beam
- Novel Applications of a Focused Ion Beam Workstation for Specimen Preparation and Nanostructuring
- Automated X-Ray Elemental Analysis in Three Dimensions Using a Dual Beam-Focused Ion Beam System
Articles in the same Issue
- Contents/Inhalt
- Inhalt / Contents
- Editorial
- Editorial
- Technical Contributions/Fachbeiträge
- Elektronenmikroskopische Untersuchung der Mikrostruktur von pseudoelastischen NiTi-Stents
- Metallographic Studies on a Defective Plate Heat Exchanger
- Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM
- Fabrication and Modification of Photonic Structures with Focused Ion Beam
- Novel Applications of a Focused Ion Beam Workstation for Specimen Preparation and Nanostructuring
- Automated X-Ray Elemental Analysis in Three Dimensions Using a Dual Beam-Focused Ion Beam System