Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM

Ulrich Wendt; Gert Nolze

doi:10.3139/147.100340

Home Technology Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM

Article

Licensed

Unlicensed Requires Authentication

Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM

Published/Copyright: May 8, 2013

Published by

Become an author with De Gruyter Brill

Submit Manuscript Author Information

From the journal Practical Metallography Volume 44 Issue 5

MLA
APA
Harvard
Chicago
Vancouver

MLA
APA
Harvard
Chicago
Vancouver

Wendt, Ulrich and Nolze, Gert. "Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM" Practical Metallography, vol. 44, no. 5, 2007, pp. 236-238. https://doi.org/10.3139/147.100340

Wendt, U. & Nolze, G. (2007). Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM. Practical Metallography, 44(5), 236-238. https://doi.org/10.3139/147.100340

Wendt, U. and Nolze, G. (2007) Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM. Practical Metallography, Vol. 44 (Issue 5), pp. 236-238. https://doi.org/10.3139/147.100340

Wendt, Ulrich and Nolze, Gert. "Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM" Practical Metallography 44, no. 5 (2007): 236-238. https://doi.org/10.3139/147.100340

Wendt U, Nolze G. Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM. Practical Metallography. 2007;44(5): 236-238. https://doi.org/10.3139/147.100340

Copy

Copied to clipboard

BibTeX EndNote RIS

Received: 2006-11

Accepted: 2007-1-4

Published Online: 2013-05-08

Published in Print: 2007-05-01

You are currently not able to access this content.

Articles in the same Issue

Contents/Inhalt
Inhalt / Contents
Editorial
Editorial
Technical Contributions/Fachbeiträge
Elektronenmikroskopische Untersuchung der Mikrostruktur von pseudoelastischen NiTi-Stents
Metallographic Studies on a Defective Plate Heat Exchanger
Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM
Fabrication and Modification of Photonic Structures with Focused Ion Beam
Novel Applications of a Focused Ion Beam Workstation for Specimen Preparation and Nanostructuring
Automated X-Ray Elemental Analysis in Three Dimensions Using a Dual Beam-Focused Ion Beam System

Search journal Search the content of this journal

https://doi.org/10.3139/147.100340

Articles in the same Issue

Contents/Inhalt
Inhalt / Contents
Editorial
Editorial
Technical Contributions/Fachbeiträge
Elektronenmikroskopische Untersuchung der Mikrostruktur von pseudoelastischen NiTi-Stents
Metallographic Studies on a Defective Plate Heat Exchanger
Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM
Fabrication and Modification of Photonic Structures with Focused Ion Beam
Novel Applications of a Focused Ion Beam Workstation for Specimen Preparation and Nanostructuring
Automated X-Ray Elemental Analysis in Three Dimensions Using a Dual Beam-Focused Ion Beam System