Home Effect of minor addition of Pb upon interfacial reactions and mechanical properties at Sn-3.0Ag-0.5Cu/Cu and Sn-58Bi/Cu solder joints
Article
Licensed
Unlicensed Requires Authentication

Effect of minor addition of Pb upon interfacial reactions and mechanical properties at Sn-3.0Ag-0.5Cu/Cu and Sn-58Bi/Cu solder joints

  • Yee-Wen Yen , Weng-Ting Chou , Hong-Chih Chen , Wei-Kai Liou and Chiapyng Lee
Published/Copyright: June 11, 2013
Become an author with De Gruyter Brill

Abstract

Interfacial reactions and mechanical properties between the Cu and Pb-free solders, Sn-3.0Ag-0.5Cu and Sn-58Bi with addition of 0.1 to 1.0 wt.% Pb are investigated in this study. Two kinds of intermetallic compounds, scallop-shaped Cu6Sn5 and plane layered Cu3Sn phases, were found in both Sn-3.0Ag-0.5Cu + Pb/Cu and Sn-58Bi + Pb/Cu couples. The intermetallic compound thickness increased with longer reaction times, higher reaction temperatures and greater Pb contents. The Cu6Sn5 phase was the thicker intermetallic compound in the Sn-3.0Ag-0.5Cu + Pb/Cu couple. However, in the Sn-58Bi + Pb/Cu system, the Cu3Sn phase is the thicker intermetallic compound. Experimental results indicate that the higher Pb concentration in Sn-3.0Ag-0.5Cu or Sn-58Bi solders reduces the alloy liquidus temperature and increases the thickness of the intermetallic compound. Thicker intermetallic compounds reduce the mechanical strength of the solder joint.


* Correspondence address, Prof. Yee-Wen Yen, National Taiwan University of Science and Technology, Graduate Institute of Materials Science and Technology, 43Keelung Road, Sec. 4, Taipei 10672, Taiwan, ROC, Tel.: +886 22 737 6659, Fax: +886 22 730 1265, E-mail:

References

[1] S.Jin: JOM5 (1993) 13.10.1007/BF03222373Search in Google Scholar

[2] C.Melton: JOM45 (1993) 33.10.1007/BF03222378Search in Google Scholar

[3] P.Zarrow: Circuits Assembly10 (1999) 18.Search in Google Scholar

[4] A.Zribi, A.Clark, L.Zavalij, P.Borgesen, E.J.Cotts: J. Electron. Mater.30 (2001) 1157.Search in Google Scholar

[5] C.E.Ho, R.Y.Tsai, Y.L.Lin, C.R.Kao: J. Electron. Mater.31 (2002) 584.Search in Google Scholar

[6] M.C.Chuang, K.L.Lin: J. Electron. Mater.32 (2003) 1426.Search in Google Scholar

[7] C.H.Raeder, L.E.Felton, D.B.Knorr, G.B.Schmeelk, D.Lee: IEEE/CHMT Euro. Inter. Electron. Manu. Techn. Symp. (1993) 119.Search in Google Scholar

[8] P.T.Vianco, A.C.Kilgo, R.Grant: J. Electron. Mater.24 (1995) 1493.Search in Google Scholar

[9] J.J.W.Morris, J.L.F.Goldstein, Z.Mei: J. Mater.49 (1997) 25.Search in Google Scholar

[10] Q.Zhu, M.Sheng, L.Luo: Soldering & Surface Mount Tech.12/3 (2000) 19.Search in Google Scholar

[11] R.Strauss, S.Smernos: Bull. Bismuth Institute49 (1986) 1.Search in Google Scholar

[12] A.Forsten, H.Steen, I.Wilding, J.Friedrich: Soldering and Surface Mount. Techn. (2000) 29.10.1108/09540910010347872Search in Google Scholar

[13] J.H.Lau, C.P.Wang, N.C.Lee, S.W.Ricky-Lee: Electronics Manufacturing, McGraw-Hill (2003) 16.Search in Google Scholar

[14] U.R.Kattner, K.W.Moon, W.J.Boettinger, C.A.Handwerker, D.J.Lee: J. Electron. Mater.30 (2001) 45.Search in Google Scholar

[15] H.Baker (Ed.): ASM Handbook, Alloy Phase Diagrams Vol. 3, Materials Park. Ohio (1992) 175, 178, 335.Search in Google Scholar

[16] K.N.Tu: Mater. Chem. Phys.46 (1996) 217.10.1016/S0254-0584(97)80016-8Search in Google Scholar

[17] H.K.Kim, K.N.Tu: Phys. Rev. B53 (1996) 16027.Search in Google Scholar

[18] C.M.Chen, L.T.Chen, Y.S.Lin: J. Electron. Mater.36 (2007) 168Search in Google Scholar

[19] L.Yang, J.K.Shang: J. Electron. Mater., Vol.34 (2005) 1363.Search in Google Scholar

[20] U.R.Kattner: JOM54 (2002) 45.10.1007/BF02709189Search in Google Scholar

[21] A.Rahn: The Basics of Soldering, John Wiley & Sons, New York (1993).Search in Google Scholar

Received: 2007-9-28
Accepted: 2008-7-11
Published Online: 2013-06-11
Published in Print: 2008-11-01

© 2008, Carl Hanser Verlag, München

Downloaded on 23.11.2025 from https://www.degruyterbrill.com/document/doi/10.3139/146.101760/html
Scroll to top button