Article
Open Access
Analysis of noise properties of an optocoupler device
-
A. Konczakowska
,
J. Cichosz
Published/Copyright:
September 1, 2007
Published Online: 2007-9-1
Published in Print: 2007-9-1
© 2007 SEP, Warsaw
Articles in the same Issue
- A Sagnac-Michelson fibre optic interferometer: Signal processing for disturbance localization
- Electromagnetic wave propagation through frequency-dispersive and lossy double-negative slab
- Direct measurement of group dispersion of optical components using white-light spectral interferometry
- Analysis of noise properties of an optocoupler device
- Electrooptical behaviour and control of a suspended particle device
- Large-dimensional light-emitting elements with printed electroluminophore
- Exciton localization behaviour in different well width undoped GaN/Al0.07Ga0.93N nanostructures
- Sensor properties of planar waveguide structures with grating couplers
Creative Commons
BY-NC-ND 3.0
Articles in the same Issue
- A Sagnac-Michelson fibre optic interferometer: Signal processing for disturbance localization
- Electromagnetic wave propagation through frequency-dispersive and lossy double-negative slab
- Direct measurement of group dispersion of optical components using white-light spectral interferometry
- Analysis of noise properties of an optocoupler device
- Electrooptical behaviour and control of a suspended particle device
- Large-dimensional light-emitting elements with printed electroluminophore
- Exciton localization behaviour in different well width undoped GaN/Al0.07Ga0.93N nanostructures
- Sensor properties of planar waveguide structures with grating couplers
