Article
Open Access
Direct measurement of group dispersion of optical components using white-light spectral interferometry
-
R. Chlebus
,
P. Hlubina
Published/Copyright:
September 1, 2007
Published Online: 2007-9-1
Published in Print: 2007-9-1
© 2007 SEP, Warsaw
Articles in the same Issue
- A Sagnac-Michelson fibre optic interferometer: Signal processing for disturbance localization
- Electromagnetic wave propagation through frequency-dispersive and lossy double-negative slab
- Direct measurement of group dispersion of optical components using white-light spectral interferometry
- Analysis of noise properties of an optocoupler device
- Electrooptical behaviour and control of a suspended particle device
- Large-dimensional light-emitting elements with printed electroluminophore
- Exciton localization behaviour in different well width undoped GaN/Al0.07Ga0.93N nanostructures
- Sensor properties of planar waveguide structures with grating couplers
Keywords for this article
spectral interferometry;
white-light source;
low-resolution spectrometer;
Mach-Zehnder interferometer;
group refractive index;
dispersion;
quartz crystal;
holey fiber
Creative Commons
BY-NC-ND 3.0
Articles in the same Issue
- A Sagnac-Michelson fibre optic interferometer: Signal processing for disturbance localization
- Electromagnetic wave propagation through frequency-dispersive and lossy double-negative slab
- Direct measurement of group dispersion of optical components using white-light spectral interferometry
- Analysis of noise properties of an optocoupler device
- Electrooptical behaviour and control of a suspended particle device
- Large-dimensional light-emitting elements with printed electroluminophore
- Exciton localization behaviour in different well width undoped GaN/Al0.07Ga0.93N nanostructures
- Sensor properties of planar waveguide structures with grating couplers
