Wettability of plasma-polymerized vinyltriethoxysilane film
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Soňa Lichovníková
,
Jan Studýnka
Abstract
Plasma-polymerized films of vinyltriethoxysilane were surface characterized using the sessile drop technique. The surface free energy and its components were evaluated using the Owens-Wendt-Kaelble geometric mean method, Wu harmonic mean method, and van Oss, Chaudhury, and Good acid-base theory. Influence of deposition conditions on the surface free energy was demonstrated in the study. Improved wettability of the films was related to the diminished concentration of apolar methyl groups in plasma polymers. An increased concentration of carbonyl and hydroxyl groups resulted in a very small improvement of the polar component.
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© 2009 Institute of Chemistry, Slovak Academy of Sciences
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- A novel kinetic-spectrophotometric method for determination of nitrites in water
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- Application of 31P NMR for added polyphosphate determination in pork meat
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- Artificial neural network prediction of steric hindrance parameter of polymers
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- Preparation and characterization of porous cordierite for potential use in cellular ceramics
- Characterization of NiFe2O4 nanoparticles synthesized by various methods
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