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Submicrometer optical characterization of the grain boundary of optically active Cr3+ doped polycrystalline Al2O3 by near-field spectroscopy

  • Yoshihito Narita EMAIL logo and Hiroshi Murotani
Published/Copyright: March 28, 2015
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Abstract

Near-field fluorescent spectroscopy was used to characterize the grain boundary of Cr-doped polycrystalline alumina. The results show that the peak widths in near-field spectra are narrower than in spectra obtained by conventional microspectrometry, and this is attributed to the difference in spatial resolution of the two methods. The R-line peaks of Cr3+ fluorescence were observed to shift to a lower wavelength at the grain boundary compared to the bulk crystal, which is attributed to stress relief at the crystal boundary. This peak shift at the boundary decreases as a function of the time a polycrystal is annealed at 1700 °C.

Received: 2001-8-31
Accepted: 2002-3-21
Published Online: 2015-3-28
Published in Print: 2002-8-1

© 2015 by Walter de Gruyter Berlin/Boston

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