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Partial information about structures with the aid of convolutions

Published/Copyright: August 25, 2010
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Abstract

In X-ray structure analysis a number of rules are known for the extraction of particular aspects of a structure from the interference pattern, such as a periodicity or its projection onto a plane for instance. It is demonstrated in this paper that these and other examples of partial information can be expressed by a convolution of the actual electron-density distribution ϱ (x) with appropriate “modifying functions” μ(x). With the aid of the convolution theorem of Fourier transforms a simple relationship to Fourier space is established. A common mathematical formulation of apparently different methods is thereby obtained. This provides a clear understanding of the conclusions which may be drawn from certain properties of the interference function, and facilitates an extension of the basic ideas to less familiar applications.

Published Online: 2010-08-25
Published in Print: 1978
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