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A study on the limit of application of kinematical theory of X-ray diffraction

  • Diego Felix Dias EMAIL logo and José Marcos Sasaki
Published/Copyright: August 27, 2020

Abstract

In this work, the limit of application of the kinematical theory of X-ray diffraction was calculate integrated intensities was evaluated as a function of perfect crystal thickness, when compared with the Ewald–Laue dynamical theory. The percentual difference between the dynamical and kinematical integrated intensities was calculated as a function of unit cell volume, Bragg angle, wavelength, module, and phase of structure factor and linear absorption coefficient. A critical thickness was defined to be the value for which the intensities differ 5%. We show that this critical thickness is 13.7% of the extinction length, which a specific combination of the parameters mentioned before. Also, we find a general expression, for any percentage of the difference between both theories, to determine the validity of the application of the kinematical theory. Finally, we also showed that the linear absorption decreases this critical thickness.


Corresponding author: Diego Felix Dias, Physics Department, X-ray Laboratory, Federal University of Ceará, 60440-970, Fortaleza, Ceará, Brazil, E-mail:

  1. Author contribution: All the authors have accepted responsibility for the entire content of this submitted manuscript and approved submission.

  2. Research funding: None declared.

  3. Conflict of interest statement: The authors declare no conflicts of interest regarding this article.

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Received: 2019-03-31
Accepted: 2020-07-10
Published Online: 2020-08-27
Published in Print: 2020-11-26

© 2020 Walter de Gruyter GmbH, Berlin/Boston

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