Considering spectral variability for optical material abundance estimation
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Wolfgang Krippner
Wolfgang Krippner received the B.Sc. and M.Sc. degrees in electrical engineering from the Technische Universität Darmstadt (TU Darmstadt), Darmstadt Germany, in 2013 and 2016, respectively. Since 2016, he has been a Research Associate with the Institute of Industrial Information Technology, KIT. His research interests are system modeling, signal and image processing, and communications.
Karlsruhe Institute of Technology (KIT), Institute of Industrial Information Technology (IIIT), Karlsruhe, Germany
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Sebastian Bauer
Sebastian Bauer received the B.Sc. and M.Sc. degrees in electrical engineering from the Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, in 2010 and 2012, respectively. Since 2013, he has been a Research Associate with the Institute of Industrial Information Technology, KIT. His research interests are system modeling, signal and image processing, and communications.
Karlsruhe Institute of Technology (KIT), Institute of Industrial Information Technology (IIIT), Karlsruhe, Germany
Fernando Puente León received the Dipl.-Ing. degree in electrical engineering and the Ph.D. degree in automated visual inspection from the Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, in 1994 and 1999, respectively. He is currently a Professor with the Department of Electrical Engineering and Information Technology, KIT, where he heads the Institute of Industrial Information Technology. From 2001 to 2002, he was with DS2, Valencia, Spain. From 2002 to 2003, he was a Post-Doctoral Research Associate with the Institut für Mess-und Regelungstechnik, KIT, and a Professor with the Department of Electrical Engineering and Information Technology, Technische Universität München, Munich, Germany, from 2003 to 2008. His research interests include image processing, automated visual inspection, information fusion, measurement technology, pattern recognition, and communications.
Karlsruhe Institute of Technology (KIT), Institute of Industrial Information Technology (IIIT), Karlsruhe, Germany
Abstract
Hyperspectral images include information enabling the determination of material abundances. Due to the fact that the acquisition of hyperspectral images is time consuming and the processing of these images is computationally costly, we propose an optical approach using spectral filters to retrieve the material abundances. The application of a spectral filter leads to an intensity image encoding estimates for the abundances of a specific material. The acquisition and processing of hyperspectral images becomes superfluous. However, the determination of spectral filters offers a large degree of freedom. In this work, we focus on methods for designing spectral filters incorporating spectral variability. Particularly, we account for reducing the negative effects of spectral variability on the accuracy of estimates for material abundances. According to experimental evaluations, we conclude that including spectral variability into the calculation of spectral filters leads to more accurate abundance estimates when mixed spectra of the considered material mixtures sufficiently fulfill the linear mixing model.
Zusammenfassung
Die in hyperspektralen Bildern enthaltene Information ermöglicht es, Materialanteile zu bestimmen. Allerdings ist die Aufnahme und Verarbeitung von hyperspektralen Bildern zeitaufwändig und rechenintensiv. Deshalb wird in dieser Arbeit ein optischer Ansatz verfolgt. Eine wesentliche Rolle nehmen dabei sogenannte Spektralfilter ein. Sie erlauben es, einzelne Intensitätsbilder aufzuzeichnen, welche jeweils bereits Schätzungen der zu ermittelnden Anteile der Materialien in den betrachteten Mischungen darstellen. Die Untersuchung von hyperspektralen Bildern ist nicht mehr notwendig. Der Entwurf dieser Spektralfilter beinhaltet jedoch viele Freiheitsgrade bei der Bestimmung ihrer Koeffizienten. Dabei wird in den Methoden dieser Arbeit insbesondere der spektralen Variabilität Aufmerksamkeit geschenkt: Unterschiedliche Pixelspektren desselben Materials variieren aufgrund der Spektrenvariabilität untereinander. Diese Variabilität führt zu ungenauen Schätzungen der Materialanteile. Es werden mehrere Verfahren für die Berechnung von Spektralfiltern mit dem Ziel der Reduzierung der Auswirkung der Spektrenvariabilität auf die Materialanteilsschätzung entwickelt. Die aufgeführten experimentellen Auswertungen zeigen genauere Anteilsschätzungen, sofern die Spektren der Materialmischungen dem angenommenen linearen Mischmodell genügen.
About the authors
Wolfgang Krippner received the B.Sc. and M.Sc. degrees in electrical engineering from the Technische Universität Darmstadt (TU Darmstadt), Darmstadt Germany, in 2013 and 2016, respectively. Since 2016, he has been a Research Associate with the Institute of Industrial Information Technology, KIT. His research interests are system modeling, signal and image processing, and communications.
Karlsruhe Institute of Technology (KIT), Institute of Industrial Information Technology (IIIT), Karlsruhe, Germany
Sebastian Bauer received the B.Sc. and M.Sc. degrees in electrical engineering from the Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, in 2010 and 2012, respectively. Since 2013, he has been a Research Associate with the Institute of Industrial Information Technology, KIT. His research interests are system modeling, signal and image processing, and communications.
Karlsruhe Institute of Technology (KIT), Institute of Industrial Information Technology (IIIT), Karlsruhe, Germany
Fernando Puente León received the Dipl.-Ing. degree in electrical engineering and the Ph.D. degree in automated visual inspection from the Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, in 1994 and 1999, respectively. He is currently a Professor with the Department of Electrical Engineering and Information Technology, KIT, where he heads the Institute of Industrial Information Technology. From 2001 to 2002, he was with DS2, Valencia, Spain. From 2002 to 2003, he was a Post-Doctoral Research Associate with the Institut für Mess-und Regelungstechnik, KIT, and a Professor with the Department of Electrical Engineering and Information Technology, Technische Universität München, Munich, Germany, from 2003 to 2008. His research interests include image processing, automated visual inspection, information fusion, measurement technology, pattern recognition, and communications.
Karlsruhe Institute of Technology (KIT), Institute of Industrial Information Technology (IIIT), Karlsruhe, Germany
©2017 Walter de Gruyter Berlin/Boston
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Articles in the same Issue
- Frontmatter
- Editorial
- Optical characterization of materials 2017
- Beiträge
- Considering spectral variability for optical material abundance estimation
- Automatic detection of fused tungsten carbides for the characterization of welding process
- Durchführbarkeitsstudie zur Inline-Überwachung der Wärmeleitfähigkeit und der strukturellen Qualität von Kunststoffen im Heißextrusionsprozess mittels Infrarot-Thermographie
- Non-invasive assessment of the bioburden of minced pork using a hand-held fluorescence device
- Evaluation and comparison of NIR multi-product calibration methods for Brix prediction
- THz imaging for recycling of black plastics
- Motion-based material characterization in sensor-based sorting
