Embracing innovation in microscopy
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Richard Henderson
Greetings to the readers of the inaugural volume of “Methods in Microscopy” (MiM). It is with great pleasure that I add my voice to that of the Editorial Team and Editorial Board in celebrating the launch of this groundbreaking journal, dedicated to advancing the methodologies that underpin modern microscopy. As an expert in the field of transmission electron microscopy, especially electron cryomicroscopy of biological structures, and an advocate for rigorous scientific exploration, I am delighted to witness MiM’s commitment to excellence in methodological documentation and reproducibility.
Microscopy has long been a cornerstone of scientific discovery, enabling us to explore the intricate details of the microscopic realm with unprecedented clarity and precision. Today, as technological advancements continue to redefine the boundaries of what is possible, it is imperative that we maintain rigorous standards in experimental design and reporting.
MiM stands at the forefront of this endeavour, providing a platform where innovative experimental procedures – from optical Methods in Microscopy (DeGruyter Vol. 1) & QEM detector development consortium microscopy to advanced electron and ion microscopy – are meticulously documented and shared. By embracing open access and adhering to rigorous peer review practices, MiM not only ensures the accessibility of cutting-edge research but also fosters a culture of transparency and collaboration within the scientific community.
In this inaugural volume, you will find a wealth of articles that showcase the ingenuity and dedication of researchers worldwide. Each contribution represents a step forward in our quest to unravel the complexities of the microscopic world and harness its potential for transformative discoveries.
I commend the editorial team, led by Roger Wepf, Andreas Thoss and Martin Friedrich for their vision and commitment to excellence. Their efforts, supported by a distinguished editorial board and esteemed partner societies, are laying a solid foundation for MiM to emerge as a cornerstone of methodological innovation in microscopy.
As we embark on this journey together, I encourage researchers, practitioners, and enthusiasts alike to engage with MiM and contribute to its growth as a premier publication in the field of microscopy. Let us embrace innovation, uphold scientific rigor, and inspire future generations to push the boundaries of what is possible.
Warm regards,
Richard Henderson
16 July 2024
© 2024 the author(s), published by De Gruyter on behalf of Thoss Media
This work is licensed under the Creative Commons Attribution 4.0 International License.
Articles in the same Issue
- Frontmatter
- Editorials
- Empowering the Microscopy Community: Welcome to the Inaugural Issue of Methods in Microscopy
- Embracing innovation in microscopy
- News
- Microscopy Community News
- Special Issue: Volume Microscopy Across Scales
- View
- Array tomography: trails to discovery
- Tutorial
- Quantification of collective signalling in time-lapse microscopy images
- Research Articles
- A systematic approach of vitrification by high pressure freezing
- FAST-EM array tomography: a workflow for multibeam volume electron microscopy
- Converting a symmetrical Gaussian beam into a thin tunable light sheet
- Serial block-face scanning electron microscopy of adherent cells on thin plastic substrate
- How to increase freeze-substitution and electron microscopy embedding reliability
Articles in the same Issue
- Frontmatter
- Editorials
- Empowering the Microscopy Community: Welcome to the Inaugural Issue of Methods in Microscopy
- Embracing innovation in microscopy
- News
- Microscopy Community News
- Special Issue: Volume Microscopy Across Scales
- View
- Array tomography: trails to discovery
- Tutorial
- Quantification of collective signalling in time-lapse microscopy images
- Research Articles
- A systematic approach of vitrification by high pressure freezing
- FAST-EM array tomography: a workflow for multibeam volume electron microscopy
- Converting a symmetrical Gaussian beam into a thin tunable light sheet
- Serial block-face scanning electron microscopy of adherent cells on thin plastic substrate
- How to increase freeze-substitution and electron microscopy embedding reliability
