With great excitement, we present the inaugural issue of Methods in Microscopy (MiM). This journal marks a significant development in the microscopy field born from a decade-long effort to address an essential need within the scientific community.
The genesis of MiM lies in a recognized gap in the literature. Experts from various scientific imaging disciplines have highlighted several critical issues: a decline in detailed descriptions of experimental workflows, underreporting of essential methodological know-how, and the increased occurrence of artifacts in peer-reviewed articles. Comprehensive explanations of experiments, including sample preparations and methodologies, have often been overshadowed by research results and their interpretations. In 2012, Roger Wepf, then-President of the European Microscopy Society, identified this critical gap in discussions with peers. Together with Martin Friedrich, he explored the necessity of a dedicated methods journal for microscopy. Despite their efforts, the idea did not initially gain support from major publishers. This concept was revisited in the summer of 2023 when Martin discussed the concept with Andreas Thoss. With his experience in founding and managing scientific journals, he immediately recognized the potential and importance of this initiative. We collaboratively refined our vision into a viable business proposal and established a partnership with the respected medium-sized publishing company, De Gruyter. Our collective commitment to advancing the field of microscopy has culminated in establishing MiM.
Methods in Microscopy is dedicated to addressing a unique need within the scientific community. While many journals publish findings in microscopy, few focus exclusively on the development and refinement of microscopy techniques. MiM aims to be the foremost platform for methodological advancements in this field, providing researchers with the latest tools, techniques, and insights to enhance their work. Our journal encompasses a wide range of topics, including but not limited to:
Optical Microscopy
Fluorescence Microscopy
Super-Resolution Microscopy
Electron and Ion Microscopy (Low- and High Voltage)
Correlative Microscopy
Scanning Probe Microscopy
Microscopy combined with Spectroscopy
Image Analysis and Processing
Automated Microscopy Techniques
Software and Hardware Development for Microscopy
MiM’s scope is broad, spanning fields such as life sciences, material science, nanotechnology, medicine, physics, chemistry, mineralogy, forensics, and archaeology. This multidisciplinary approach ensures that our journal serves as a central hub for innovations that advance microscopy capabilities across diverse scientific domains.
MiM is committed to open access publishing. All articles are published under the CC BY 4.0 license, ensuring that research is freely accessible to anyone, globally. This model increases the visibility and impact of published work and fosters greater collaboration and dissemination of knowledge. We offer a range of manuscript types, including Letters, Research Articles, Review Articles, Tutorials, and Views. This flexibility allows authors to choose the best format for presenting their findings and insights.
We are particularly proud to highlight that our inaugural issue features submissions from esteemed institutions around the world, reflecting the high level of interest and engagement within the microscopy community. Furthermore, the rapid evolution of our editorial board underscores this enthusiasm, showcasing the dedication and support of leading experts in the field.
As we embark on this journey, we invite researchers, professionals, and enthusiasts in the microscopy community to contribute to MiM. Your expertise and innovation are essential to the success of this journal. We are committed to publishing groundbreaking research that will shape the future of microscopy. On behalf of the editorial team, we express our gratitude for your support and look forward to your contributions.
Sincerely,
Roger Wepf, Founding Editor-in-Chief
Martin Friedrich, Editor
Andreas Thoss, Publishing Editor
Methods in Microscopy
For more information and submission guidelines, please visit our website at www.degruyter.com/MiM. We are dedicated to advancing the field of microscopy and eagerly anticipate the contributions that will emerge through Methods in Microscopy.
© 2024 the author(s), published by De Gruyter on behalf of Thoss Media
This work is licensed under the Creative Commons Attribution 4.0 International License.
Articles in the same Issue
- Frontmatter
- Editorials
- Empowering the Microscopy Community: Welcome to the Inaugural Issue of Methods in Microscopy
- Embracing innovation in microscopy
- News
- Microscopy Community News
- Special Issue: Volume Microscopy Across Scales
- View
- Array tomography: trails to discovery
- Tutorial
- Quantification of collective signalling in time-lapse microscopy images
- Research Articles
- A systematic approach of vitrification by high pressure freezing
- FAST-EM array tomography: a workflow for multibeam volume electron microscopy
- Converting a symmetrical Gaussian beam into a thin tunable light sheet
- Serial block-face scanning electron microscopy of adherent cells on thin plastic substrate
- How to increase freeze-substitution and electron microscopy embedding reliability
Articles in the same Issue
- Frontmatter
- Editorials
- Empowering the Microscopy Community: Welcome to the Inaugural Issue of Methods in Microscopy
- Embracing innovation in microscopy
- News
- Microscopy Community News
- Special Issue: Volume Microscopy Across Scales
- View
- Array tomography: trails to discovery
- Tutorial
- Quantification of collective signalling in time-lapse microscopy images
- Research Articles
- A systematic approach of vitrification by high pressure freezing
- FAST-EM array tomography: a workflow for multibeam volume electron microscopy
- Converting a symmetrical Gaussian beam into a thin tunable light sheet
- Serial block-face scanning electron microscopy of adherent cells on thin plastic substrate
- How to increase freeze-substitution and electron microscopy embedding reliability