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Topography effects in AFM force mapping experiments on xylan-decorated cellulose thin films

  • Christian Ganser , Katrin Niegelhell , Caterina Czibula , Angela Chemelli , Christian Teichert , Robert Schennach and Stefan Spirk EMAIL logo
Published/Copyright: August 8, 2016
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Abstract

Xylan-coated cellulose thin films has been investigated by means of atomic force microscopy (AFM) and force mapping experiments. The birch xylan deposition on the film was performed under control by means of a multiple parameter surface plasmon resonance spectroscopy (MP-SPR) under dynamic conditions. The coated films were submitted to AFM in phase imaging mode to force mapping with modified AFM tips (sensitive to hydrophilic OH and hydrophobic CH3 groups) in order to characterize and localize the xylan on the surfaces. At the first glance, a clear difference in the adhesion force between xylan-coated areas and cellulose has been observed. However, these different adhesion forces originate from topography effects, which prevent an unambiguous identification and subsequent localization of the xylan on the cellulosic surfaces.

Acknowledgments

The financial support of the Federal Ministry of Economy, Family and Youth and the National Foundation for Research, Technology and Development, Austria (CD-Labor für Oberflächenphysikalische und chemische Grundlagen der Papierfestigkeit), is gratefully acknowledged. The author(s) would like to acknowledge the contribution of the COST Action FP1105.

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Received: 2016-1-30
Accepted: 2016-7-5
Published Online: 2016-8-8
Published in Print: 2016-12-1

©2016 Walter de Gruyter GmbH, Berlin/Boston

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