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Veröffentlicht/Copyright:
8. August 2022
Published Online: 2022-08-08
Published in Print: 2022-09-27
©2022 Walter de Gruyter GmbH, Berlin/Boston
Artikel in diesem Heft
- Frontmatter
- Community
- Conference and trade show reports
- Topical Issue: Ellipsometry; Guest Editors: Rüdiger Schmidt-Grund, Chris Sturm and Andreas Hertwig
- Views
- Mid-infrared laser ellipsometry: a new era beyond FTIR
- Editorial
- Ellipsometry and polarimetry – classical measurement techniques with always new developments, concepts, and applications
- Tutorial
- Mueller matrix spectroscopic ellipsometry
- Review Articles
- Certain topics in ellipsometric data modeling with splines: a review of recent developments
- Spectroscopic ellipsometry from 10 to 700 K
- Research Article
- Multilevel effective material approximation for modeling ellipsometric measurements on complex porous thin films
Artikel in diesem Heft
- Frontmatter
- Community
- Conference and trade show reports
- Topical Issue: Ellipsometry; Guest Editors: Rüdiger Schmidt-Grund, Chris Sturm and Andreas Hertwig
- Views
- Mid-infrared laser ellipsometry: a new era beyond FTIR
- Editorial
- Ellipsometry and polarimetry – classical measurement techniques with always new developments, concepts, and applications
- Tutorial
- Mueller matrix spectroscopic ellipsometry
- Review Articles
- Certain topics in ellipsometric data modeling with splines: a review of recent developments
- Spectroscopic ellipsometry from 10 to 700 K
- Research Article
- Multilevel effective material approximation for modeling ellipsometric measurements on complex porous thin films
