Startseite Ellipsometry study of the infrared-active phonon modes in strained SrMnO3 thin films
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Ellipsometry study of the infrared-active phonon modes in strained SrMnO3 thin films

  • Premysl Marsik ORCID logo EMAIL logo , Roberto de Andrés Prada , Andreana Daniil und Christian Bernhard ORCID logo
Veröffentlicht/Copyright: 18. August 2022
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Advanced Optical Technologies
Aus der Zeitschrift Advanced Optical Technologies Band 11 Heft 5-6

Abstract

We performed infrared and time-domain terahertz spectroscopic ellipsometry measurements of thin films of the perovskite antiferromagnetic insulator SrMnO3 that were grown by pulsed laser deposition (PLD) on LaAlO3, SrLaGaO4, and LSAT substrates which yield an epitaxial strain ranging from −0.3 to 1.7%. Taking these thin films as a representative example, we discuss the strategies for analyzing the ellipsometry spectra and extracting the information about the thin film dielectric response that can be equally applied to a variety of oxide based thin films and heterostructures. In particular, for the room temperature spectra we show that the three infrared-active phonon modes of the cubic perovskite structure of SrMnO3 undergo the expected softening with increasing tensile strain. For the SrMnO3 film on SrLaGaO4, we find that the low-energy (TO1) phonon mode reveals anomalous temperature dependence in the vicinity of the Néel temperature of about 170 K that signifies a strong spin-phonon coupling. For the SrMnO3 film on LSAT, we identify some irreversible changes of the infrared ellipsometry spectra that occur as the sample is heated to elevated temperature up to 560 K. These changes of the ellipsometry spectra have been attributed to a partial oxygen loss of the SrMnO3 thin film since they can be reverted with a post annealing treatment under high oxygen pressure.

Keywords: infrared ellipsometry; multiferroics; time-domain terahertz; ultrathin film
Corresponding author: Premysl Marsik, Department of Physics, University of Fribourg, Chemin du Musee 3, 1700, Fribourg, Switzerland, E-mail:

Acknowledgments

Edith Perret is acknowledged for setting up the furnace for the high-pressure annealing.

  1. Author contributions: P.M. planned the project, performed the ellipsometry experiments, and authored the manuscript. R.de A.P. grew and characterized the samples. A.D. performed the O2 annealing experiements and related x-ray and ellipsometry characterization. C.B. consulted and contributed to the manuscript.

  2. Research funding: This work was supported by SNF project No. 200020-172611.

  3. Conflict of interest statement: The authors declare no conflicts of interest regarding this article.

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Received: 2022-03-17
Accepted: 2022-07-07
Published Online: 2022-08-18
Published in Print: 2022-12-16

© 2022 Walter de Gruyter GmbH, Berlin/Boston

Artikel in diesem Heft

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  2. Editorial
  3. Making impact
  4. Community
  5. EOS annual meeting EOSAM 2022
  6. Topical Issue: Ellipsometry Part 2; Guest Editors: Rüdiger Schmidt-Grund, Chris Sturm and Andreas Hertwig
  7. Review Article
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  10. Combination of a global-search method with model selection criteria for the ellipsometric data evaluation of DLC coatings
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https://doi.org/10.1515/aot-2022-0009
Schlagwörter für diesen Artikel
infrared ellipsometry; multiferroics; time-domain terahertz; ultrathin film

Artikel in diesem Heft

  1. Frontmatter
  2. Editorial
  3. Making impact
  4. Community
  5. EOS annual meeting EOSAM 2022
  6. Topical Issue: Ellipsometry Part 2; Guest Editors: Rüdiger Schmidt-Grund, Chris Sturm and Andreas Hertwig
  7. Review Article
  8. Polarimetric techniques for the structural studies and diagnosis of brain
  9. Research Articles
  10. Combination of a global-search method with model selection criteria for the ellipsometric data evaluation of DLC coatings
  11. Ellipsometry study of the infrared-active phonon modes in strained SrMnO3 thin films
  12. Research Articles
  13. A generalised thermal LED-model and its applications
  14. Novel procedure for the identification of a starting point for the CMP
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