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Published/Copyright:
November 7, 2022
Published Online: 2022-11-07
Published in Print: 2022-12-16
©2022 Walter de Gruyter GmbH, Berlin/Boston
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Articles in the same Issue
- Frontmatter
- Editorial
- Making impact
- Community
- EOS annual meeting EOSAM 2022
- Topical Issue: Ellipsometry Part 2; Guest Editors: Rüdiger Schmidt-Grund, Chris Sturm and Andreas Hertwig
- Review Article
- Polarimetric techniques for the structural studies and diagnosis of brain
- Research Articles
- Combination of a global-search method with model selection criteria for the ellipsometric data evaluation of DLC coatings
- Ellipsometry study of the infrared-active phonon modes in strained SrMnO3 thin films
- Research Articles
- A generalised thermal LED-model and its applications
- Novel procedure for the identification of a starting point for the CMP
