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Reliability Test Plans for Exponentiated Log-Logistic Distribution
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K. Rosaiah
Published/Copyright:
March 10, 2010
Abstract
A generalization of the log-logistic distribution called exponentiated log-logistic distribution (in lines of exponentiated Weibull distribution suggested by Mudholkar and Srivastava [Technometrics 37: 436-445, 1995]) is considered. In this paper the operating characteristic for a sampling plan is determined for the case that a lot of products is submitted for inspection with lifetimes specified by an exponentiated log-logistic distribution (ELLD). The results are illustrated by a numerical example.
Published Online: 2010-03-10
Published in Print: 2006-October
© Heldermann Verlag
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Articles in the same Issue
- A Note on Run Length Variability Reduction for EWMA Charting
- A Note on Nature and Significance of Stochastic Models
- Estimation of Pareto Survival Function in the Presence of Outlying Observations
- Loss Reduction in Point Estimation Problems
- Application of Arithmetic-Geometric Mean Inequality for Construction of Reliability Test Plan for Parallel Systems in the Presence of Covariates
- On Bayesian Estimation in a Parallel System
- Approximating Reliability of a System with Doubly Bounded Performance Functions
- Probability Weighted Moments Approach to Quality Control Charts
- Weibull Extension of Bivariate Exponential Regression Model with Gamma Frailty for Survival Data
- Nonlinear Tobit Decomposition
- Reliability Test Plans for Exponentiated Log-Logistic Distribution
- Transient Analysis of a System with Queue Dependent Servers and Controllable Arrivals
