Modified Tightened Three Level Continuous Sampling Plan
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Saminathan Balamurali
Abstract
In this paper, a modification is proposed to the tightened three level continuous sampling plan. The tightened three level plan is one of the three tightened multi-level continuous sampling plans of Derman et. al. (Annals of Mathematical Statistics 28: 395-404, 1957) with three sampling levels and is designated as MLP – T – 3. Using a Markov chain model, expressions for the performance measures of the modified MLP – T – 3 plan are derived. The modified MLP – T – 3 plan is shown to be identical to the MLP – T – 3 plan and CSP – T plan, where CSP – T plan is a special case of MLP – T – 3 plan. Tables are also presented for the selection of a modified MLP – T – 3 plan when the AQL or LQL and AOQL are specified.
© Heldermann Verlag
Articles in the same Issue
- Determination of Specifications for Tensile Strength of Castings
- Joint Design of Economic Manufacturing Quantity, Sampling Plan and Specification Limits
- Measurement Procedures for the Variance of a Normal Distribution
- A Bayesian View on Detecting Drifts by Nonparametric Methods
- Combining Process and Product Control for Reducing Sampling Costs
- Modelling of Explosives Sensitivity Part 2: The Weibull-Model
- Modified Tightened Three Level Continuous Sampling Plan
- A Note on the Continuous Sampling Plan CSP-V
Articles in the same Issue
- Determination of Specifications for Tensile Strength of Castings
- Joint Design of Economic Manufacturing Quantity, Sampling Plan and Specification Limits
- Measurement Procedures for the Variance of a Normal Distribution
- A Bayesian View on Detecting Drifts by Nonparametric Methods
- Combining Process and Product Control for Reducing Sampling Costs
- Modelling of Explosives Sensitivity Part 2: The Weibull-Model
- Modified Tightened Three Level Continuous Sampling Plan
- A Note on the Continuous Sampling Plan CSP-V