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Zur Kompensation der elektrostatischen Kräfte bei der Messung elektrooptischer Effekte
Published/Copyright:
July 28, 2010
Abstract
In usual arrangements for measuring quadratic electrooptic effects the electrostatic attraction of the electrodes produces piezooptic effects, which are of the same order of magnitude as the intrinsic effects. Employing auxiliary electrodes, a full compensation of these stresses within the crystal can be achieved. By these means also the determination of piezooptic constants is possible. The method is tested with several crystals comparing the measured piezooptic constants with literature values.
Published Online: 2010-7-28
Published in Print: 1977-2-1
© 2015 Oldenbourg Wissenschaftsverlag GmbH, Rosenheimer Str. 145, 81671 München
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Articles in the same Issue
- The crystal structure of germanium dibromide*
- Quadratischer elektrostriktiver Tensor des rhombischen Calciumformiats
- Die Kristallstruktur von Fe2Si, ihre Verwandtschaft zu den Ordnungsstrukturen des α-(Fe,Si)-Mischkristalls und zur Fe5Si3-Struktur
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- Clinoptilolite: the distribution of potassium atoms and its role in thermal stability
- Die Kristallstruktur von (+)- und (−)-Ru[C6H5(CH3)PCH2CH2,P(C6H5)CH3],Cl2
- Zur Kompensation der elektrostatischen Kräfte bei der Messung elektrooptischer Effekte
- Tables of the Σ1 relationships: triclinic, monoclinic and orthorhombic space groups
- The crystal structure of C.I. Pigment Red 6, 4-chloro-2-nitrophenylazo-2-naphthol
- Madelung constants for millerite-type structures and for high-pressure GeP-type structures: a contribution to the crystal chemistry of A[5]B[5] compounds
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