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Determination of phonon dispersion relations by X-ray thermal diffuse scattering
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Ruqing Xu
Veröffentlicht/Copyright:
25. September 2009
Abstract
Thermal diffuse scattering (TDS) of X-rays from crystals contains information on phonons. This paper reviews the general theory of TDS and some recent experiments aimed at further developing TDS into a useful and efficient method for studying phonon dispersion relations.
Published Online: 2009-9-25
Published in Print: 2005-12-1
© by Oldenbourg Wissenschaftsverlag, München, Germany
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Artikel in diesem Heft
- Grazing incidence diffraction of cadmium arachidate multilayers at the solid-liquid interface
- Editorial: Diffuse Scattering
- Diffuse scattering from microstructures and mesostructures
- Atomic pair distribution function analysis of materials containing crystalline and amorphous phases
- Determination of phonon dispersion relations by X-ray thermal diffuse scattering
- Diffuse scattering and disorder in zirconia
- Disorder, structured diffuse scattering and the transmissionelectron microscope
- Modelling disorder in 3,3′-dimethoxybenzil, C16H14O4
- Diffuse scattering and phason modes in the i-AlPdMn quasicrystalline phase
- Problems in measuring diffuse X-ray scattering
- Case studies of molecular disorder
- Stacking disorder: the hexagonal polymorph of tris(bicyclo[2.1.1]hexeno)benzene and related examples
- Diffuse X-ray scattering from tiny sample volumes
- Magnetic short-range order in disordered and ordered binary alloys
- Diffuse scattering in the layered perovskites
- Cooperative Evolution — a new algorithm for the investigation of disordered structures via Monte Carlo modelling
