Bandwidth and Centre Frequency of Mask-Tuned Microwave Plasma Gratings in Semiconductor Coplanar Waveguides

Walter Platte,

doi:10.1515/FREQ.2001.55.7-8.214

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Bandwidth and Centre Frequency of Mask-Tuned Microwave Plasma Gratings in Semiconductor Coplanar Waveguides

Walter Platte,

Veröffentlicht/Copyright: 1. Juli 2001

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Platte,, Walter. "Bandwidth and Centre Frequency of Mask-Tuned Microwave Plasma Gratings in Semiconductor Coplanar Waveguides" Frequenz, vol. 55, no. 7-8, 2001, pp. 214-218. https://doi.org/10.1515/FREQ.2001.55.7-8.214

Platte,, W. (2001). Bandwidth and Centre Frequency of Mask-Tuned Microwave Plasma Gratings in Semiconductor Coplanar Waveguides. Frequenz, 55(7-8), 214-218. https://doi.org/10.1515/FREQ.2001.55.7-8.214

Platte,, W. (2001) Bandwidth and Centre Frequency of Mask-Tuned Microwave Plasma Gratings in Semiconductor Coplanar Waveguides. Frequenz, Vol. 55 (Issue 7-8), pp. 214-218. https://doi.org/10.1515/FREQ.2001.55.7-8.214

Platte,, Walter. "Bandwidth and Centre Frequency of Mask-Tuned Microwave Plasma Gratings in Semiconductor Coplanar Waveguides" Frequenz 55, no. 7-8 (2001): 214-218. https://doi.org/10.1515/FREQ.2001.55.7-8.214

Platte, W. Bandwidth and Centre Frequency of Mask-Tuned Microwave Plasma Gratings in Semiconductor Coplanar Waveguides. Frequenz. 2001;55(7-8): 214-218. https://doi.org/10.1515/FREQ.2001.55.7-8.214

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Published Online: 2001-07

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https://doi.org/10.1515/FREQ.2001.55.7-8.214

Artikel in diesem Heft

Inhaltsübersicht
Echtzeitfähiges breitbandiges Meßsystem zur Vermessung zeitvarianter Indoor-Funkkanäle
Breitbandige Vermessung zeitvarianter Indoor-Funkkanäle zur Untersuchung des Einflusses bewegter Streuer
Joint Detection and Joint Pre-Distortion Techniques for SD/TD/CDMA Systems
Bandwidth and Centre Frequency of Mask-Tuned Microwave Plasma Gratings in Semiconductor Coplanar Waveguides
Novel CMOS Composite Transistor for Low Voltage Low Power Applications
New OTA-Based Sinusoidal Oscillators with Fully Uncoupled Control of Oscillation Frequency and Condition
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