tm - Technisches Messen
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Volume 83, Issue 11

tm - Technisches Messen
This issue is in the journal

Contents
  • Publicly Available
    Frontmatter
    November 3, 2016
    Page range: i-iv
  • Beiträge
  • Requires Authentication Unlicensed
    Licensed
    Multiskalige Oberflächeninspektion mit Wavelets und Deflektometrie
    October 13, 2016
    Thomas Greiner, Tan-Toan Le, Mathias Ziebarth, Michael Heizmann
    Page range: 617-627
  • October 13, 2016
    Sylvia Apostol, Veronika Putz, Thomas Unger, Jürgen Miethlinger
    Page range: 628-646
  • October 26, 2016
    Christoph Beisteiner, Richard Gstöttenmayr, Thomas Altmanninger, Bernhard G. Zagar
    Page range: 647-659
  • October 26, 2016
    Mirko Javurek, Andreas Mittermair
    Page range: 660-665
  • October 26, 2016
    Mirko Javurek, Andreas Mittermair
    Page range: 666-680
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