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Determination of Stress Gradients by X-ray Diffraction: Comparison of Different Methods and Applications

  • Stéphanie Bein , Christian Le Calvez and Jean-Lou Lebrun
Published/Copyright: December 14, 2021

Abstract

The paper presents a review of the main theoretical formulations of the analysis of steep stress gradients by X-ray diffraction and a comparison of calculations with experimentally applied stresses in a four-point bending test on a beryllium specimen. The comparison between theoretical approaches and experiments is therefore limited to uniaxial linear stress gradients. It shows that, in this case, only an evaluation of stress gradient can be obtained from the analysis of X-ray diffraction measurements even when experiments are performed very carefully. In this direction, very complex formulations could often not be necessary. Then, a summary of advantages and drawbacks of each theoretical approach is presented. Finally, for different forms of stress gradients, the paper proposes the most convenient formalism and experimental technique to be used.


S. Bein, Laboratoire Sols, Solides et Structures (CNRS UMR 5521 - INPG/ UJF), B.P. 53, F-38041 Grenoble CEDEX 9 , France
Ch. Le Calvez, CRMC, Creusot Loire Industrie, 56 rue Clemenceau, F-71202 Le Creusot, France.
J.-L. Lebrun, LM3 - METX, URA CNRS 1219, ENSAM, 151 bd de l'Hôpital, F-75013 Paris, France.

  1. The authors gratefully acknowledge the team of LURE laboratory (Orsay) for allowing the use of synchrotron radiation and for valuable help in performing the experiments. The authors also acknowledge P. Gergaud for stimulating discussions and developments about GIXD formulae and C. Saifoudine for participating in the experimentations.

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Received: 1997-01-29
Published Online: 2021-12-14

© 1998 Carl Hanser Verlag, München

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