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Application of the Tomographic Atom Probe to Selected Problems in Materials Science

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Published/Copyright: November 9, 2021

Abstract

Field-Ion Microscopy (FIM), equipped with a time of flight detection facility (Atom Probe APFIM) has been established as a sensitive analytical method for the investigation of the local chemical compositions on nanometer scales. Because of its high in-depth resolution of a few tenths of a nanometer, the magnification of some 107, and the equal detection sensitivity for all elements, this method has helped to solve key problems in surface science, materials research and materials engineering.

The newly developed Tomographic Atom Probe (TAP) is equipped with a position sensitive detection system and is able to provide spatially resolved information in real space on the chemical microstructure of materials and compounds with atomic resolution. The sampled volume is about two orders of magnitude larger than that usually analysed with the APFIM. The extended set of data collected by the TAP is stored and may be treated with special visualising tools. Three dimensional images can be created, which include all the information on microstructure and chemical composition of the sampled volume.

The paper demonstrates the capability of the TAP by presenting results from two investigations regarding phase separation and characterization of layer structures, respectively. For the first category TAP images of the time evolution of the decomposition of the Cu44.7Ni47.3Fe8 alloy during thermal ageing at 773 K are discussed. For the second one, results on the structure of the interfaces of sputter deposited Ni/Zr multilayers are treated. Such layers appear to be amorphous already after room temperature preparation. The thermal stability of Cu/Pd interfaces in sputter deposited multilayers is discussed with regard to the determination of interdiffusion coefficients from these data.


T. Al-Kassab, H. Wollenberger, Hahn-Meitner-Institut Berlin GmbH, Glienicker Straße 100, D-14109 Berlin, Germany;
D. Blavette, Laboratoire de Microscopie Ionique, URA CNRS 808, Université de Rouen, F-76821 Mont Saint Aignan, France; also with the Institute Universitaire de France.

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Received: 1996-07-05
Published Online: 2021-11-09

© 1997 Carl Hanser Verlag, München

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