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TEM Sample Preparation of a Hard Metal by Semiautomatic Wedge Polishing

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Published/Copyright: August 12, 2013
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Abstract

Sintered hard metals like tungsten carbide compounds are a challenge for TEM sample preparation due to the diverging properties of the individual components. Especially when both very thin as well as large areas are required, for example for nanoanalysis investigations, conventional preparation techniques like ion milling and FIB preparation are often incapable of delivering samples of necessary quality. In this study, the preparation of a hard metal consisting of a tungsten carbide/cobalt compound via a technique called “Wedge Polishing” is described, along with the results of concomitant TEM investigations. The impact of the preparation procedure on the crystallographic structure of the material is discussed, and a post-treatment process to dispose of these artefacts is presented.

Kurzfassung

Sinterhartmetalle wie beispielsweise Wolframcarbidverbindungen sind aufgrund unterschiedlicher Eigenschaften der einzelnen Bestandteile eine Herausforderung in der TEM-Probenpräparation. Insbesondere dann, wenn sowohl sehr dünne als auch große Flächen benötigt werden, z. B. für Untersuchungen im Bereich der Nanoanalytik, sind herkömmliche Präparationstechniken wie die Ionendünnung und die Präparation mittels FIB oft unzureichend, um Proben einer erforderlichen Qualität herzustellen. Diese Untersuchung beschreibt die Präparation eines Hartmetalls aus einer Wolframcarbid/Cobalt-Verbindung mittels des sogenannten „Wedge Polishing“, der Herstellung einer keilförmigen Probe mittels Schleifen bzw. Polieren, und präsentiert die Ergebnisse begleitender TEM-Untersuchungen. Diskutiert wird der Einfluss des Präparationsverfahrens auf die kristallographische Struktur des Werkstoffs. Ferner wird ein Nachbehandlungsverfahren zur Beseitigung solcher Artefakte präsentiert.

References / Literatur

[1] Williams, D. B.; Carter, C. B.: Transmission Electron Microscopy, 2nd edition, Springer, New York, USA, 200910.1007/978-0-387-76501-3Search in Google Scholar

[2] Ayache, J.; Beaunier, L.; Boumendil, J.; Ehret, G.; LaubD.: Sample Preparation Handbook for Transmission Electron Microscopy – Techniques, Springer, New York, USA, 201010.1007/978-1-4419-5975-1Search in Google Scholar

[3] Klepeis, S. J.; Benedict, J.; Anderson, R. M.: A Grinding/Polishing Tool for TEM Sample Preparation, in: Mater. Res. Soc. Symp. Proc.155 (1988) 179184Search in Google Scholar

[4] Mkhoyan, K.; Maccagnano-Zacher, S.; Kirkland, E.; Silcox, J.: Ultramicroscopy108 (2008) 79180210.1016/j.ultramic.2008.01.007Search in Google Scholar

[5] McCaffrey, J.; Phaneuf, M.; Madsen, L.: Ultramicroscopy87 (2001) 9710410.1016/S0304-3991(00)00096-6Search in Google Scholar

[6] Barna, A.; Pécz, B.; Menyhard, M.: Ultramicroscopy70 (1998) 1611710.1016/S0304-3991(97)00120-4Search in Google Scholar

[7] Centre National de la Recherche Scientifique; Ayache, J.: Transmission Electron Microscopy (TEM): sample reparation guide – guides to methodology, (2011) http://temsamprep.in2p3.fr/guides_methodologiques.php?lang=engSearch in Google Scholar

[8] Eberg, E.; Monsen, A. F.; Typbell, T.; Helvoort, A. V.; Holmestad, R.: J. Electron Microsc.57 (2008) 17517910.1093/jmicro/dfn018Search in Google Scholar

[9] Traeholt, C.; Wen, J.; Svetchnikov, V.; Delsing, A.; Zandbergen, H.: Physica C206, (1993) 31832810.1016/0921-4534(93)90531-TSearch in Google Scholar

[10] Ayache, J.; Albaréde, P.: Ultramicroscopy60 (1995) 19520610.1016/0304-3991(95)00073-8Search in Google Scholar

[11] Botton, G. A.; Lazar, S.; Dwyer, C.: Ultramicroscopy110 (2010) 92693410.1016/j.ultramic.2010.03.008Search in Google Scholar

[12] Hay, R. S.; Welch, J. R.; Cinibulk, M. K.: Thin Solid Films308–309 (1997) 38939210.1016/S0040-6090(97)00673-1Search in Google Scholar

[13] Hay, R. S.; Welch, J. R.; Cinibulk, M. K.: Transmission Electron Microscopy Specimen Preparation of Ceramic Coatings on Ceramic Fibers, in: Mater. Res. Soc. Symp. Proc.408 (1997) 317Search in Google Scholar

[14] Chraskaa, T.; King, A.: Surf. Coat. Technol.157 (2002) 23824610.1016/S0257-8972(02)00181-0Search in Google Scholar

[15] Voyles, P.; Grazul, J.; Muller, D.: Ultramicroscopy96 (2003) 25127310.1016/S0304-3991(03)00092-5Search in Google Scholar

[16] Sidorov, M. V.; Smith, D. J.: Cross-Sectional Transmission Electron Microscopy of Si-based Nanostructures, in Mater. Res. Soc. Symp. Proc.441 (1996) 77377810.1557/PROC-441-773Search in Google Scholar

[17] Kato, N.; Maruyama, H.; Saka, H.: J. Electron Microsc.50 (2001) 91310.1093/jmicro/50.1.9Search in Google Scholar

[18] Wang, J. Y.; Lewis, L. H.; Zhu, Y.; Welch, D.; Sellers, C.; Branagan, D.; Panchanathan, V.: J. Appl. Phys.81 (1997) 5094509610.1063/1.365186Search in Google Scholar

[19] Smith, D. J.; Cullen, D. A.; Zhou, L.; McCartney, M. R.: Microelectron. Reliab.50 (2010) 1514151910.1016/j.microrel.2010.07.155Search in Google Scholar

[20] Okuno, H.; Takeguchi, M.; Mitsuishi, K.; Guo, X.; Furuya, K.: J. Electron Microsc.57 (2008) 1510.1093/jmicro/dfm034Search in Google Scholar

[21] Chen, J.; Ivey, D.: Micron33 (2002) 48949210.1016/S0968-4328(01)00038-5Search in Google Scholar

[22] Smeeton, T.; Kappers, M. J.; Barnard, J. S.; Vickers, M. E.; HumphreysC. J.: Appl. Phys. Lett.83 (2003) 5419542110.1063/1.1636534Search in Google Scholar

[23] Ayache, J.; Beaunier, L.; Boumendil, J.; Ehret, G.; Laub, D.: Sample Preparation Handbook for Transmission Electron Microscopy – Methodology, Springer, New York, USA, 201010.1007/978-1-4419-5975-1Search in Google Scholar

Received: 2012-11-15
Accepted: 2013-1-7
Published Online: 2013-08-12
Published in Print: 2013-05-15

© 2013, Carl Hanser Verlag, München

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