Guided-Ion Beam Measurements of Ar+ + Ar Symmetric Charge-transfer Cross Sections at Ion Energies Ranging from 0.2 to 300 eV
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S.H. Pullins
Guided-Ion Beam (GIB) measurements of the Ar+ + Ar symmetric charge-transfer (SCT) system are presented for ion energies ranging from 0.2 to 300 eV. Two methods are applied to distinguish primary and secondary ions: (i) based on isotopic-labeling, (ii) based on significant laboratory velocity differences. The absolute cross sections measured with these methods are in excellent agreement at energies above 1 eV. The experimental results are compared with semi-classical calculations performed with various published Ar2+ potentials. The calculations including spin-orbit effects lie within 10% of the isotope-selected and attenuation measurements at all investigated ion energies. The present results lie significantly above the simple Rapp and Francis model [1]. Important errors in the latter approach are pointed out and a correct one-electron model is proposed. First measurements of the differential cross section at 0.5 eV collision energy are briefly mentioned.
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Artikel in diesem Heft
- New Scheme for Measuring the Angular Momentum Spatial Anisotropy of Vibrationally Excited H2 via the I 1Πg State
- On the Dissipative Properties of Coherent Radiation
- Theoretical Study of the Heats of Formation of SF, FSO, FSO2 and HSO Radicals
- Evidence of a Cage Effect in Superfluid Helium Droplets
- Dynamics of Benzonitrile, Propylene Carbonate and Butylene Carbonate: the Influence of Molecular Shape and Flexibility on the Dielectric Relaxation Behaviour of Dipolar Aprotic Liquids
- Periodic Nanostructures
- Global Geometry Optimization of Molecular Clusters: TIP4P Water
- Molecular Dynamics Simulation of Femtosecond Pump-Probe Experiments on I2 in Ar Environments
- Guided-Ion Beam Measurements of Ar+ + Ar Symmetric Charge-transfer Cross Sections at Ion Energies Ranging from 0.2 to 300 eV
