Article
Open Access
Instrumental profile of MYTHEN detector in Debye-Scherrer geometry
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Fabia Gozzo
Published/Copyright:
October 13, 2010
Published Online: 2010-10-13
Published in Print: 2010-12
© by Oldenbourg Wissenschaftsverlag, Villigen PSI, Germany
Articles in the same Issue
- Preface: 12th European Powder Diffraction Conference (EPDIC 12)
- The Rietveld Method: A Retrospection
- The Dual-Space resolution bias correction in EXPO2010
- MIL-53(Fe): a good example to illustrate the power of powder diffraction in the field of MOFs
- Powder diffraction methods for studies of borohydride-based energy storage materials
- Time-dependent analysis of K2PtBr6 binding to lysozyme studied by protein powder and single crystal X-ray analysis
- Preliminary insights into the non structural protein 3 macro domain of the Mayaro virus by powder diffraction
- Diffraction peaks from correlated dislocations
- Nanocrystals: Breaking limitations of data analysis
- Magnetic response of (Cr,Al,Si)N nanocrystallites on the microstructure of Cr—Al—Si—N nanocomposites
- Structural inhomogeneity in silicon-on-insulator probed with coherent X-ray diffraction
- Instrumental profile of MYTHEN detector in Debye-Scherrer geometry
Keywords for this article
Instrumental line profile;
Profile aberrations;
Synchrotron radiation XRPD;
Debye-Scherrer geometry;
Position sensitive detector
Articles in the same Issue
- Preface: 12th European Powder Diffraction Conference (EPDIC 12)
- The Rietveld Method: A Retrospection
- The Dual-Space resolution bias correction in EXPO2010
- MIL-53(Fe): a good example to illustrate the power of powder diffraction in the field of MOFs
- Powder diffraction methods for studies of borohydride-based energy storage materials
- Time-dependent analysis of K2PtBr6 binding to lysozyme studied by protein powder and single crystal X-ray analysis
- Preliminary insights into the non structural protein 3 macro domain of the Mayaro virus by powder diffraction
- Diffraction peaks from correlated dislocations
- Nanocrystals: Breaking limitations of data analysis
- Magnetic response of (Cr,Al,Si)N nanocrystallites on the microstructure of Cr—Al—Si—N nanocomposites
- Structural inhomogeneity in silicon-on-insulator probed with coherent X-ray diffraction
- Instrumental profile of MYTHEN detector in Debye-Scherrer geometry