Article
Open Access
Nanocrystals: Breaking limitations of data analysis
-
B. Palosz
Published/Copyright:
November 5, 2010
Published Online: 2010-11-05
Published in Print: 2010-12
© by Oldenbourg Wissenschaftsverlag, Warschau, Germany
Articles in the same Issue
- Preface: 12th European Powder Diffraction Conference (EPDIC 12)
- The Rietveld Method: A Retrospection
- The Dual-Space resolution bias correction in EXPO2010
- MIL-53(Fe): a good example to illustrate the power of powder diffraction in the field of MOFs
- Powder diffraction methods for studies of borohydride-based energy storage materials
- Time-dependent analysis of K2PtBr6 binding to lysozyme studied by protein powder and single crystal X-ray analysis
- Preliminary insights into the non structural protein 3 macro domain of the Mayaro virus by powder diffraction
- Diffraction peaks from correlated dislocations
- Nanocrystals: Breaking limitations of data analysis
- Magnetic response of (Cr,Al,Si)N nanocrystallites on the microstructure of Cr—Al—Si—N nanocomposites
- Structural inhomogeneity in silicon-on-insulator probed with coherent X-ray diffraction
- Instrumental profile of MYTHEN detector in Debye-Scherrer geometry
Articles in the same Issue
- Preface: 12th European Powder Diffraction Conference (EPDIC 12)
- The Rietveld Method: A Retrospection
- The Dual-Space resolution bias correction in EXPO2010
- MIL-53(Fe): a good example to illustrate the power of powder diffraction in the field of MOFs
- Powder diffraction methods for studies of borohydride-based energy storage materials
- Time-dependent analysis of K2PtBr6 binding to lysozyme studied by protein powder and single crystal X-ray analysis
- Preliminary insights into the non structural protein 3 macro domain of the Mayaro virus by powder diffraction
- Diffraction peaks from correlated dislocations
- Nanocrystals: Breaking limitations of data analysis
- Magnetic response of (Cr,Al,Si)N nanocrystallites on the microstructure of Cr—Al—Si—N nanocomposites
- Structural inhomogeneity in silicon-on-insulator probed with coherent X-ray diffraction
- Instrumental profile of MYTHEN detector in Debye-Scherrer geometry