The use of lattice-parameter changes to trace the kinetics of phase transformations powder-diffraction analysis of disorder-order transformations in Ni1+δSn
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Andreas Leineweber
The measurement of lattice-parameter changes by X-ray powder diffraction as a function of the progress of a phase transformation (e.g. as a function of the annealing time at a given annealing temperature) is a powerful means to study the kinetics of phase transformations in crystalline solids. Generally applicable diffraction methods have been developed and applied in a study of the kinetics of different types of disorder → order-related phase transformations in Ni1 + δSn alloys (δ = 0.50, 0.35). It has been demonstrated, in particular, how the activation energies of occurring processes can be determined from annealing-time-dependent data recorded at different annealing temperatures. Two approaches have been presented and applied:(i) a general approach constrained by identity of the start states and the end states of the transformation for all investigated annealing temperatures(ii) an explicit model-based approach adopting a specific time and temperature dependence of the meas ured lattice parameters.
© Oldenbourg Wissenschaftsverlag
Articles in the same Issue
- Preface: State of the Art of Powder Diffraction
- Direct space methods of structure determination from powder diffraction: principles, guidelines and perspectives
- Nanocrystalline materials studied by powder diffraction line profile analysis
- Whole Powder Pattern Modelling of cubic metal powders deformed by high energy milling
- Kinematical diffraction by distorted crystals – dislocation X-ray line broadening
- The use of lattice-parameter changes to trace the kinetics of phase transformations powder-diffraction analysis of disorder-order transformations in Ni1+δSn
- Diffraction stress analysis of elastic grain interaction in polycrystalline materials
- Neutron diffraction studies of the atomic thermal vibrations in complex materials: application of the Wilson method to examination of micro- and nano-crystalline SiC
- Using X-ray powder diffraction and principal component analysis to determine structural properties for bulk samples of multiwall carbon nanotubes
- Using X-ray diffraction in forensic science
- Preferred crystallographic orientation in mature and juvenile wood
- Instrument aberrations in a 4-circle powder diffractometer
Articles in the same Issue
- Preface: State of the Art of Powder Diffraction
- Direct space methods of structure determination from powder diffraction: principles, guidelines and perspectives
- Nanocrystalline materials studied by powder diffraction line profile analysis
- Whole Powder Pattern Modelling of cubic metal powders deformed by high energy milling
- Kinematical diffraction by distorted crystals – dislocation X-ray line broadening
- The use of lattice-parameter changes to trace the kinetics of phase transformations powder-diffraction analysis of disorder-order transformations in Ni1+δSn
- Diffraction stress analysis of elastic grain interaction in polycrystalline materials
- Neutron diffraction studies of the atomic thermal vibrations in complex materials: application of the Wilson method to examination of micro- and nano-crystalline SiC
- Using X-ray powder diffraction and principal component analysis to determine structural properties for bulk samples of multiwall carbon nanotubes
- Using X-ray diffraction in forensic science
- Preferred crystallographic orientation in mature and juvenile wood
- Instrument aberrations in a 4-circle powder diffractometer
