Nanocrystalline materials studied by powder diffraction line profile analysis
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Tamas Ungár
X-ray powder diffraction is a powerful tool for characterising the microstructure of crystalline materials in terms of size and strain. It is widely applied for nanocrystalline materials, especially since other methods, in particular electron microscopy is, on the one hand tedious and time consuming, on the other hand, due to the often metastable states of nanomaterials it might change their microstructures. It is attempted to overview the applications of microstruture characterization by powder diffraction on nanocrystalline metals, alloys, ceramics and carbon base materials. Whenever opportunity is given, the data provided by the X-ray method are compared and discussed together with results of electron microscopy. Since the topic is vast we do not try to cover the entire field.
© Oldenbourg Wissenschaftsverlag
Articles in the same Issue
- Preface: State of the Art of Powder Diffraction
- Direct space methods of structure determination from powder diffraction: principles, guidelines and perspectives
- Nanocrystalline materials studied by powder diffraction line profile analysis
- Whole Powder Pattern Modelling of cubic metal powders deformed by high energy milling
- Kinematical diffraction by distorted crystals – dislocation X-ray line broadening
- The use of lattice-parameter changes to trace the kinetics of phase transformations powder-diffraction analysis of disorder-order transformations in Ni1+δSn
- Diffraction stress analysis of elastic grain interaction in polycrystalline materials
- Neutron diffraction studies of the atomic thermal vibrations in complex materials: application of the Wilson method to examination of micro- and nano-crystalline SiC
- Using X-ray powder diffraction and principal component analysis to determine structural properties for bulk samples of multiwall carbon nanotubes
- Using X-ray diffraction in forensic science
- Preferred crystallographic orientation in mature and juvenile wood
- Instrument aberrations in a 4-circle powder diffractometer
Articles in the same Issue
- Preface: State of the Art of Powder Diffraction
- Direct space methods of structure determination from powder diffraction: principles, guidelines and perspectives
- Nanocrystalline materials studied by powder diffraction line profile analysis
- Whole Powder Pattern Modelling of cubic metal powders deformed by high energy milling
- Kinematical diffraction by distorted crystals – dislocation X-ray line broadening
- The use of lattice-parameter changes to trace the kinetics of phase transformations powder-diffraction analysis of disorder-order transformations in Ni1+δSn
- Diffraction stress analysis of elastic grain interaction in polycrystalline materials
- Neutron diffraction studies of the atomic thermal vibrations in complex materials: application of the Wilson method to examination of micro- and nano-crystalline SiC
- Using X-ray powder diffraction and principal component analysis to determine structural properties for bulk samples of multiwall carbon nanotubes
- Using X-ray diffraction in forensic science
- Preferred crystallographic orientation in mature and juvenile wood
- Instrument aberrations in a 4-circle powder diffractometer
