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Instrument aberrations in a 4-circle powder diffractometer
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Arnold C. Vermeulen
Published/Copyright:
September 25, 2009
A theoretical basis for the effects of instrument aberrations on the position of the diffraction peak in a 4-circle powder diffractometer is given. Peak shifts due to non-intersecting rotation axes, displacement of the incident beam and displacement of the specimen height are all described on the basis of pure analytical functions. These functions may be useful as software corrections on the measured peak positions in residual stress analysis. The theoretical derivation includes an analytical description of the position of the measurement spot in specimen coordinates. This may be useful for improving the instrument performance in micro-diffraction analysis.
Keywords: Misalignments; Instrument aberrations; Alignment errors; Non-ideal diffractometer; 4-circle powder diffractometer
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Received: 2006-January-16
Accepted: 2006-May-9
Published Online: 2009-9-25
Published in Print: 2007-3-1
© Oldenbourg Wissenschaftsverlag
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Keywords for this article
Misalignments;
Instrument aberrations;
Alignment errors;
Non-ideal diffractometer;
4-circle powder diffractometer
Articles in the same Issue
- Preface: State of the Art of Powder Diffraction
- Direct space methods of structure determination from powder diffraction: principles, guidelines and perspectives
- Nanocrystalline materials studied by powder diffraction line profile analysis
- Whole Powder Pattern Modelling of cubic metal powders deformed by high energy milling
- Kinematical diffraction by distorted crystals – dislocation X-ray line broadening
- The use of lattice-parameter changes to trace the kinetics of phase transformations powder-diffraction analysis of disorder-order transformations in Ni1+δSn
- Diffraction stress analysis of elastic grain interaction in polycrystalline materials
- Neutron diffraction studies of the atomic thermal vibrations in complex materials: application of the Wilson method to examination of micro- and nano-crystalline SiC
- Using X-ray powder diffraction and principal component analysis to determine structural properties for bulk samples of multiwall carbon nanotubes
- Using X-ray diffraction in forensic science
- Preferred crystallographic orientation in mature and juvenile wood
- Instrument aberrations in a 4-circle powder diffractometer
