Quantitative structural analysis of individual nanotubes by electron diffraction
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Jian-Min Zuo
A general method for quantitative structure analysis of individual, cylindrical, carbon nanotubes is described here. The method is based on electron diffraction of individual nanotubes and analysis using a combination of helical diffraction theory and diffraction geometry of the underlying lattice. Experimental recording of nanotube diffraction is achieved using a nanometer-sized electron beam. Procedures are developed for 1) the measurement of chiral angles in both single- and multi-wall nanotubes and 2) structure determination based on Bessel function fitting of layer line intensity oscillations. The accuracy of the method is demonstrated for the structure determination of a single- and double-wall carbon nanotubes and partial structural analysis of a multiwall carbon nanotube. The results show that the single-, double- and incommensurate multi-wall tubes are well described by the cylindrical tube model. However, a large Debye-Waller factor in the radial direction is obtained. The method developed here is general and can be applied to other cylindrical nanotubes.
© Oldenbourg Wissenschaftsverlag
Articles in the same Issue
- Preface: Nanocrystallography
- Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis
- Application of the apparent lattice parameter to determination of the core-shell structure of nanocrystals
- The formation and characterization of three-dimensional gold nanocrystal superlattices
- Grazing exit small angle X-ray scattering on grain formation in polycrystalline metal films
- Solving the 3D structure of metal nanoparticles
- Structure of nanosized materials by high-energy X-ray diffraction: study of titanate nanotubes
- Local atomic structure in disordered and nanocrystalline catalytic materials
- Quantitative structural analysis of individual nanotubes by electron diffraction
- Structural fingerprinting in the transmission electron microscope: overview and opportunities to implement enhanced strategies for nanocrystal identification
- Vibrational properties of metallic nanoparticles
- X-ray computed tomography in Zernike phase contrast mode at 8 keV with 50-nm resolution using Cu rotating anode X-ray source
- Sol-gel synthesis of rodlike polysilsesquioxanes forming regular higher-ordered nanostructure
- Crystal growth from cluster to bulk materials via nanomaterials
Articles in the same Issue
- Preface: Nanocrystallography
- Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis
- Application of the apparent lattice parameter to determination of the core-shell structure of nanocrystals
- The formation and characterization of three-dimensional gold nanocrystal superlattices
- Grazing exit small angle X-ray scattering on grain formation in polycrystalline metal films
- Solving the 3D structure of metal nanoparticles
- Structure of nanosized materials by high-energy X-ray diffraction: study of titanate nanotubes
- Local atomic structure in disordered and nanocrystalline catalytic materials
- Quantitative structural analysis of individual nanotubes by electron diffraction
- Structural fingerprinting in the transmission electron microscope: overview and opportunities to implement enhanced strategies for nanocrystal identification
- Vibrational properties of metallic nanoparticles
- X-ray computed tomography in Zernike phase contrast mode at 8 keV with 50-nm resolution using Cu rotating anode X-ray source
- Sol-gel synthesis of rodlike polysilsesquioxanes forming regular higher-ordered nanostructure
- Crystal growth from cluster to bulk materials via nanomaterials
