Diffuse X-ray scattering from tiny sample volumes
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Gene E. Ice
, Rozaliya I. Barabash und Wenjun Liu
Abstract
The emergence of intense synchrotron X-ray sources, efficient focusing optics and high-performance X-ray sensitive area detectors allows for measurements of diffuse scattering from cubic micron-scale sample vol umes. Here we present an experiment that illustrates methods for studying the local structure and defect content of tiny sample volumes. In the experiment, an X-ray microbeam illuminating about ∼5 μm3 of a Ni-based superalloy single crystal, is used to collect Laue patterns and reciprocal space volume maps around fundamental and a superstructure reflections. This measurement illustrates how diffuse reciprocal-space distributions can be collected with good spatial and momentum-transfer resolution from a tiny real-space sample volume. This example demonstrates that emerging diffuse scattering techniques can provide fundamentally new information about crystallographic organization and defect content over many length scales.
© by Oldenbourg Wissenschaftsverlag, München, Germany
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- Grazing incidence diffraction of cadmium arachidate multilayers at the solid-liquid interface
- Editorial: Diffuse Scattering
- Diffuse scattering from microstructures and mesostructures
- Atomic pair distribution function analysis of materials containing crystalline and amorphous phases
- Determination of phonon dispersion relations by X-ray thermal diffuse scattering
- Diffuse scattering and disorder in zirconia
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- Problems in measuring diffuse X-ray scattering
- Case studies of molecular disorder
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- Diffuse X-ray scattering from tiny sample volumes
- Magnetic short-range order in disordered and ordered binary alloys
- Diffuse scattering in the layered perovskites
- Cooperative Evolution — a new algorithm for the investigation of disordered structures via Monte Carlo modelling