Home TEM-Präparationsverfahren zur Querschnittanalyse von Schnellstopp- Spanproben aus TiAI6V4 / Preparation Method of Ti6Al4V Quick-Stop Specimens for Cross- Sectional TEM-Analyses
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TEM-Präparationsverfahren zur Querschnittanalyse von Schnellstopp- Spanproben aus TiAI6V4 / Preparation Method of Ti6Al4V Quick-Stop Specimens for Cross- Sectional TEM-Analyses

  • Carsten Siemers , Debashis Mukherji , Christa Grusewski and Joachim Rösler
Published/Copyright: May 27, 2021
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Online erschienen: 2021-05-27
Erschienen im Druck: 2004-02-01

© 2021 by Walter de Gruyter Berlin/Boston

Downloaded on 11.9.2025 from https://www.degruyterbrill.com/document/doi/10.1515/pm-2004-410203/html
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