Home Methode zur TEM-Untersuchung der Schmalseite kaltgewalzter AI-Folien / Method for edge-on TEM-observation of cold rolled AI foils
Article
Licensed
Unlicensed Requires Authentication

Methode zur TEM-Untersuchung der Schmalseite kaltgewalzter AI-Folien / Method for edge-on TEM-observation of cold rolled AI foils

  • H. Abral , P. Schlund , H.-G. Sockel and W. Blum
Published/Copyright: February 15, 2024
Become an author with De Gruyter Brill

Online erschienen: 2024-02-15
Erschienen im Druck: 1998-03-01

© 2024 by Walter de Gruyter Berlin/Boston

Downloaded on 21.10.2025 from https://www.degruyterbrill.com/document/doi/10.1515/pm-1998-350302/html
Scroll to top button