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Untersuchung der Nickelbasislegierung Inconel 7383 _ mit dem Rasterelektronenmikroskop und der Mikrosonde / Investigation of Inconel 738 with the Scanning Electron Microscope (SEM) and the Electron Beam Analyser / Etude de Inconel 738 avec le microscope électronique à balayage et la microsonde électronique

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Published/Copyright: May 8, 2021
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Published Online: 2021-05-08
Published in Print: 1978-10-01

© 2021 by Walter de Gruyter Berlin/Boston

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