Abstract
Based on finite difference (FD) method, recently applied to investigate propagation characteristics of optical waveguides, we verify its applicability to predict the electric field and propagation parameter of planar waveguide for the entire range of normalized frequencies. As a test case, we crosscheck our FD result for symmetric step index planar waveguide and then predict the propagation characteristics of crucial planar waveguide structures like exponential index and Epstein layer model profile. Our findings show high degree of accuracy when compared with published results.
Keywords: optical planar waveguide; step index profile; exponential index profile; Epstein model profile
Received: 2013-5-4
Accepted: 2013-7-13
Published Online: 2013-12-6
Published in Print: 2013-12-1
©[2013] by Walter de Gruyter Berlin Boston
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Schlagwörter für diesen Artikel
optical planar waveguide;
step index profile;
exponential index profile;
Epstein model profile
Artikel in diesem Heft
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