Abstract
An anharmonic oscillator
Acknowledgements
The authors thank the referee for the useful comments which helped improve the contents of the paper.
References
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© 2020 Walter de Gruyter GmbH, Berlin/Boston
Artikel in diesem Heft
- Frontmatter
- Conditional stability for an inverse coefficient problem of a weakly coupled time-fractional diffusion system with half order by Carleman estimate
- A perturbation analysis based on group sparse representation with orthogonal matching pursuit
- Inverse spectral problem of an anharmonic oscillator on a half-axis with the Neumann boundary condition
- Space-time finite element method for determination of a source in parabolic equations from boundary observations
- On dynamical input reconstruction in a distributed second order equation
- Alternating minimization methods for strongly convex optimization
- Inverse scattering transform in two spatial dimensions for the N-wave interaction problem with a dispersive term
- Reconstruction algorithm of 3D surface in scanning electron microscopy with backscattered electron detector
- Inverse problem of Mueller polarimetry for metrological applications
- Features of solving the direct and inverse scattering problems for two sets of monopole scatterers
Artikel in diesem Heft
- Frontmatter
- Conditional stability for an inverse coefficient problem of a weakly coupled time-fractional diffusion system with half order by Carleman estimate
- A perturbation analysis based on group sparse representation with orthogonal matching pursuit
- Inverse spectral problem of an anharmonic oscillator on a half-axis with the Neumann boundary condition
- Space-time finite element method for determination of a source in parabolic equations from boundary observations
- On dynamical input reconstruction in a distributed second order equation
- Alternating minimization methods for strongly convex optimization
- Inverse scattering transform in two spatial dimensions for the N-wave interaction problem with a dispersive term
- Reconstruction algorithm of 3D surface in scanning electron microscopy with backscattered electron detector
- Inverse problem of Mueller polarimetry for metrological applications
- Features of solving the direct and inverse scattering problems for two sets of monopole scatterers