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Self-organized criticality – a model for recrystallization?

  • T. Wroblewski EMAIL logo
Published/Copyright: February 15, 2022
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Abstract

A novel X-ray diffraction method, allowing the position-resolved imaging of a polycrystalline specimen using the diffracted radiation, was applied for in situ investigation of recrystallization of cold-rolled copper. A large area of the specimen could be observed simultaneously, yielding information about nucleation and growth of many individual crystallites. The recrystallization process showed a stochastic behavior which can be described by the model of self-organized criticality.

Abstract

Die Rekristallisation von kaltgewalztem Kupfer wurde mittels einer neuartigen abbildenden Röntgenbeugungsmethode untersucht, welche die an einer polykristallinen Probe gebeugte Strahlung nutzt. Diese ermöglicht die simultane Erfassung einer großen Probenfläche und erlaubt somit die Beobachtung der Keimbildung und des Wachstums vieler einzelner Kristallite. Der Rekristallisationsprozess zeigte ein stochastisches Verhalten, welches sich durch das Modell der selbstorganisierten Kritizität beschreiben lässt.


Dr. T. Wroblewski DESY, HASYLAB Notkestr. 85, D-22607 Hamburg, Germany Tel.:+49 40 8998 3004 Fax:+49 40 8998 4475

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Received: 2002-04-25
Published Online: 2022-02-15

© 2002 Carl Hanser Verlag, München

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