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A New Synthetic Triple Sampling X̅ Control Chart

  • Faijun Nahar Mim ORCID logo , Rawnak Tasnim , Michael B. C. Khoo ORCID logo EMAIL logo , Sajal Saha ORCID logo , Md. Hazrat Ali and Shanyu Chua
Published/Copyright: September 11, 2025
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Abstract

In this study, the synthetic triple sampling (STS) X ¯ chart is introduced to monitor the process mean more effectively. The developed STS X ¯ chart combines the triple sampling (TS) X ¯ chart and the conforming run length (CRL) chart to enhance shift detection capabilities. The performance of the STS X ¯ chart is compared with that of the TS X ¯ and synthetic double sampling (SDS) X ¯ charts on the basis of the average number of observations to signal (ANOS) and expected ANOS (EANOS) as key performance metrics. Results show that the process shift detection effectiveness of the STS X ¯ chart is generally superior to that of the TS X ¯ and SDS X ¯ charts. Real industrial data are adopted to demonstrate the implementation of the STS X ¯ chart.

MSC 2020: 62P30

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Received: 2025-06-27
Revised: 2025-07-29
Accepted: 2025-08-02
Published Online: 2025-09-11
Published in Print: 2025-11-01

© 2025 Walter de Gruyter GmbH, Berlin/Boston

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