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Reliability Test Plans for Percentiles Based on the Harris Generalized Linear Exponential Distribution

  • K. K. Jose EMAIL logo and Albin Paul
Published/Copyright: March 21, 2018
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Abstract

In this paper, a generalization of the Harris family of distributions, namely, the Harris generalized linear exponential distribution is discussed. The use of the model is established by fitting it to a real data set. Also, we derive a reliability test plan for acceptance or rejection of a lot of products submitted for inspection with lifetimes following this distribution.

MSC 2010: 62N05; 60E05

Award Identifier / Grant number: Emeritus Scientist Fellowship

Funding statement: The authors also gratefully acknowledge the financial assistance towards this research under Emeritus Scientist scheme of KSCSTE, Government of Kerala, Thiruvananthapuram.

Acknowledgements

The authors express their sincere gratitude to the reviewers for the valuable suggestions for improving the presentation of the paper.

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Received: 2017-10-29
Revised: 2018-3-3
Accepted: 2018-3-3
Published Online: 2018-3-21
Published in Print: 2018-6-1

© 2018 Walter de Gruyter GmbH, Berlin/Boston

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