Double Acceptance Sampling Plan for Time-Truncated Life Tests Based on Half Normal Distribution
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Amer I. Al-Omari
,
Amjad D. Al-Nasser
Abstract
In this work, we investigate a double acceptance sampling plan (DASP) based on truncated life tests when the lifetime of a product follows the half normal distribution. By fixing the consumer’s confidence level, the minimum sample sizes of the first and second samples needful to assert the specified mean life are calculated. The operating characteristic values and the minimum ratios of the mean life to the specified life are also analyzed. Several important tables are provided and a numerical example is given to illustrate the results.
References
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© 2016 by De Gruyter
Artikel in diesem Heft
- Frontmatter
- Characterizations of Kumaraswamy Laplace Distribution with Applications
- Transmuted Erlang-Truncated Exponential Distribution
- Acceptance Sampling Plans Based on Truncated Lifetime Tests for Transmuted Inverse Rayleigh Distribution
- Double Acceptance Sampling Plan for Time-Truncated Life Tests Based on Half Normal Distribution
Artikel in diesem Heft
- Frontmatter
- Characterizations of Kumaraswamy Laplace Distribution with Applications
- Transmuted Erlang-Truncated Exponential Distribution
- Acceptance Sampling Plans Based on Truncated Lifetime Tests for Transmuted Inverse Rayleigh Distribution
- Double Acceptance Sampling Plan for Time-Truncated Life Tests Based on Half Normal Distribution
