Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs
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Yulia V. Borodina
Abstract
We consider Boolean circuits in Zhegalkin basis and describe all Boolean functions that can be implemented by a circuit admitting a complete fault detection test of length 1 in case of constant faults of type “1” at gate outputs.
Note: Originally published in Diskretnaya Matematika (2019) 31, №2, 14–19 (in Russian).
Funding statement: Research was supported by RAS Presidium Program №1 “Fundamental mathematics and its applications” (grant PRAS-18-01).
References
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[5] Borodina Yu. V., Borodin P. A., “Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements”, Discrete Math. Appl., 20:4 (2010), 441–449.10.1515/dma.2010.027Search in Google Scholar
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Articles in the same Issue
- Attribute-efficient learning of Boolean functions from Post closed classes
- Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs
- Post theorem for strongly dependent n-ary semigroups
- Effective parallelization strategy for the solution of subset sum problems by the branch-and-bound method
- On the number of ones in outcome sequence of extended Pohl generator
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Articles in the same Issue
- Attribute-efficient learning of Boolean functions from Post closed classes
- Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs
- Post theorem for strongly dependent n-ary semigroups
- Effective parallelization strategy for the solution of subset sum problems by the branch-and-bound method
- On the number of ones in outcome sequence of extended Pohl generator
- The number of sumsets in Abelian group
- Generalized allocation scheme with cell occupancies from a fixed finite set
- Universal functions for linear functions depending on two variables
